We present herein a rational approach to probe the torsional strain-induced electronic transition energy
Eii variation of individual SWNTs byresonant Raman spectroscopy (RRS). When a SWNT was manipulated by AFM tip through a path perpendicular to SWNT axis, both torsionaland uniaxial strain would be introduced in SWNTs. Under the torsional strain, resonant Raman spectral mapping along a SWNT detected anM-shaped frequency (
RBM) and W-shaped intensity (
IS) variation of radial breathing mode (RBM) spectra, which were induced by the elasticretraction of the nanotubes in combination with the friction after the tip has been removed. The electronic transition energy
Eii variation alongSWNTs by torsional strain follows a family pattern based on
q = (
n -
m) mod 3: for semiconducting SWNTs,
E33S increases for
q = +1,
E33Sdecreases and
E22S increases for
q = -1, and for metallic SWNTs,
E11M always increases.