Improvement of Hematite as Photocatalyst by Doping with Tantalum
详细信息    查看全文
文摘
The use of tantalum as a highly effective dopant for hematite photoelectrochemistry (PEC) has shown contradictory results in previous reports. We show here through screening of different compositions by scanning electrochemical microscopy that Ta doping significantly improves the PEC performance of dropcast films on fluorine-doped tin oxide (FTO). In studies with larger electrodes, a 2% Ta-doped hematite photoanode fabricated at 500 掳C shows the highest improvement of photoactivity, which is 32 times higher than pure hematite even under visible light. At fabrication temperature higher than 500 掳C (e.g., 600, 680 掳C), the substrate FTO becomes more resistive and the dopant Ta prefers to segregate from the bulk phase (伪-Fe2O3) and forms tantalum fluoride oxide (TaO2F), which may act as charge-carrier recombination centers, and the corresponding Ta-doped samples show much lower photoactivities. Ta-doped hematite samples show stronger (110) diffraction as compared with the pure 伪-Fe2O3. We show that the doping of Ta induced a preferential growth along the {001} basal plane, which has been reported to have good conductivity. We found the conductivity of the Ta-doped hematite was improved up to at least about one order of magnitude after the incorporation of Ta, with the improved carrier mobility decreasing recombination of the photogenerated holes and electrons.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700