Enhancing Effects of Electron-Withdrawing Groups and Metallic Ions on Halogen Bonding in the YC6F4X路路路C2H8N2 (X = Cl, Br, I; Y = F, CN, NO2<
文摘
Halogen-bonding interactions are highly directional intermolecular interactions that are often important in crystal engineering. In this work, the second-order M酶ller鈥揚lesset perturbation theory (MP2) calculations and the quantum theory of 鈥渁toms in molecules鈥?(QTAIM) and noncovalent interaction (NCI) studies were carried out on a series of X路路路N halogen bonds between substituted haloperfluoroarenes C6F4XY (X = Cl, Br, I; Y = F, CN, NO2) as bond donors and 1,2-diaminoethane as bond acceptor. Our research supports earlier work that electron-withdrawing substituents produce an enhancement effect on the size of the 蟽-hole and the maximum positive electrostatic potentials (VS,max), which further strengthens the halogen bonding. The metallic ion M+ (M+ = Li+, Na+) has the ability to enhance the size of both the 蟽-hole and VS,max value with the formation of [MNCC6F4X]+, resulting in more electronic charge transfer away from the halogen atom X and an increase in the strength of the halogen bond. It is found that the values of VS,max at the 蟽-holes are linear in relation to the halogen-bonded interaction energies and the halogen-bonding interaction distance, indicating that the electrostatic interaction plays a key role in the halogen-bonding interactions. The values of VS,max at the 蟽-holes are also linear in relation to the electron density 蟻b, its Laplacian 2蟻b, and 鈭?i>Gb/Vb of XB, indicating that the topological properties (蟻b, 2蟻b) and energy properties (Gb, Vb) at the BCPs are correlated with the electrostatic potentials.