Super-Resolved Traction Force Microscopy (STFM)

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• 作者：Huw Colin-York ; Dilip Shrestha ; James H. Felce ; Dominic Waithe ; Emad Moeendarbary ; Simon J. Davis ; Christian Eggeling ; Marco Fritzsche
• 刊名：Nano Letters
• 出版年：2016
• 出版时间：April 13, 2016
• 年：2016
• 卷：16
• 期：4
• 页码：2633-2638
• 全文大小：488K
• 年卷期：0
• ISSN：1530-6992

文摘

Measuring small forces is a major challenge in cell biology. Here we improve the spatial resolution and accuracy of force reconstruction of the well-established technique of traction force microscopy (TFM) using STED microscopy. The increased spatial resolution of STED-TFM (STFM) allows a greater than 5-fold higher sampling of the forces generated by the cell than conventional TFM, accessing the nano instead of the micron scale. This improvement is highlighted by computer simulations and an activating RBL cell model system.