InAs/GaAs quantum dots have been subjected to a lateral external electric field in low-temperature microphotoluminescence measurements.It is demonstrated that the dot PL signal could be increased several times depending on the magnitude of the external field and the strengthof the internal (built-in) electric field, which could be altered by an additional infrared illumination of the sample. The observed effects areexplained by a model that accounts for the essentially faster lateral transport of the photoexcited carriers achieved in an electric field.