Atomic-Resolution Imaging on Alkali Halide Surfaces in Viscous Ionic Liquid Using Frequency Modulation Atomic Force Microscopy

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• 作者：Takashi Ichii ; Masahiro Negami ; Hiroyuki Sugimura
• 刊名：Journal of Physical Chemistry C
• 出版年：2014
• 出版时间：November 20, 2014
• 年：2014
• 卷：118
• 期：46
• 页码：26803-26807
• 全文大小：312K
• ISSN：1932-7455

文摘

Structural analysis of interfaces between ionic liquid (IL) and alkali-halide (100) surface was demonstrated by frequency modulation atomic force microscopy (FM-AFM). A quartz tuning fork sensor with a sharpened tungsten tip, the so-called qPlus sensor, was used as a force sensor. Atomic-resolution topographic imaging on a KCl(100) surface was successfully achieved in a viscous IL. The square lattice structure with a period of 鈭?.4 nm was clearly imaged, which indicated that only K⁺ or Cl^{鈥?/sup> ions were imaged. An abrupt shift of the tip position occurred during the topographic imaging, suggestting that the dissolution of KCl atomic layers was detected by the FM-AFM. In addition, two-dimensional force mapping was carried out, and the presence of the KCl-based layered structure on the interface was recognized.}