Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

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• 作者：Hui-Wen Cheng ; Yuan-Chih Chang ; Chi-Tsu Yuan ; Song-Nien Tang ; Chia-Seng Chang ; Jau Tang ; Fu-Rong Chen ; Rong-Long Pan ; Fan-Gang Tseng
• 刊名：The Journal of Physical Chemistry C
• 出版年：2013
• 出版时间：June 27, 2013
• 年：2013
• 卷：117
• 期：25
• 页码：13239-13246
• 全文大小：392K
• 年卷期：v.117,no.25(June 27, 2013)
• ISSN：1932-7455

文摘

This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.