Image Enhancement of Blurry DR Images Using FLIT-LBP Texture Descriptors
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  • 作者:1. ICT Research Center ; Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China ; Chongqing University ; Chongqing ; 400044 China2. College of Optoelectronic Engineering ; Chongqing University ; Chongqing ; 400044 China3. College of Mathematics and Statistics ; Chongqing University ; Chongqing ; 401331 China4. School of Electronic Engineering ; Tianjin University of Technology and Education ; Tianjin ; 300222 China
  • 关键词:Digital radiography – ; Image enhancement – ; LBP – ; FLIT – ; FLIT ; LBP
  • 刊名:Journal of Nondestructive Evaluation
  • 出版年:2011
  • 出版时间:September 2011
  • 年:2011
  • 卷:30
  • 期:3
  • 页码:179-185
  • 全文大小:498.1 KB
  • 参考文献:1. Guis, V.H., Adel, M., Rasigni, M., et al.: Adaptive neighborhood contrast enhancement in mammographic phantom images. Opt. Eng. 42(2), 357–366 (2003)
    2. Uffmann, M., Schaefer-Prokop, C.: Digital radiography: the balance between image quality and required radiation dose. Eur. J. Radiol. 72(2), 202–208 (2009)
    3. Karamad, M.J., Latifi, M., Amani-Tehran, M.: Nondestructive identification of knot types in hand-made carpet. Part 1: feature extraction from grey images. J. Nondestruct. Eval. 28(2), 55–62 (2009)
    4. Moura, E.P., Silva, R.R., Siqueira, M.H.S., et al.: Pattern recognition of weld defects in preprocessed TOFD signals using classifiers. J. Nondestruct. Eval. 23(4), 163–172 (2004)
    5. Tansel, I.N., Inanc, F., Reen, N., et al.: Neural network based thickness estimation from multiple radiographic images. J. Nondestruct. Eval. 25(2), 53–66 (2006)
    6. Yang, M.Q., Peng, Y.H., Liu, Y.X.: The algorithm and application of finite line integral transform. In: IEEE 2005 International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications Proceedings, Vols. 1 and 2, pp. 411–414 (2005)
    7. Ojala, T., Pietik盲inen, M., Harwood, D.: A comparative study of texture measures with classification based on feature distributions. Pattern Recognit. 29(1), 51–59 (1996)
    8. Pietik盲inen, M., Ojala, T., Xu, Z.: Rotation-invariant texture classification using feature distributions. Pattern Recognit. 33(1), 43–52 (2000)
    9. Ojala, T., Pietik盲inen, M., M盲enp盲盲, T.: Multiresolution gray-scale and rotation invariant texture classification with local binary patterns. IEEE Trans. Pattern Anal. Mach. Intell. 24(7), 971–987 (2002)
    10. Ahonen, T., Hadid, A., Pietik盲inen, M.: Face recognition with local binary patterns. In: Computer Vision-ECCV 2004, PT 1, vol. 3021, pp. 469–481 (2004)
    11. Tan, N.T., Huang, L., Liu, C.P.: Face recognition based on LBP and orthogonal Rank-One tensor projections. In: 19th International Conference on Pattern Recognition, Vols. 1–6, pp. 468–471 (2008)
    12. Liu, Z.H., Shi, H.L., Zhang, L.P., et al.: Face recognition based on multi-scale block local binary pattern. Comput. Sci. 36(11), 293–299 (2009) (in Chinese)
    13. Wang, X.J., Gong, H.F., Zhang, H., et al.: Palmprint identification using boosting Local Binary Pattern. In: Proceedings of the 18th International Conference on Pattern Recognition, Vol. 3, pp. 503–506 (2006)
    14. Ma, W.H., Huang, L., Liu, C.P.: Advanced local binary pattern descriptors for crowd estimation. In: PACIIA: Proceedings of the 2008 IEEE Pacific-Asia Workshop on Computational Intelligence and Industrial Application, Vols. 1–3, pp. 1906–1910 (2008)
    15. He, L.H., Zou, C.R., Zhao, L., et al.: An enhanced LBP feature based on facial expression recognition. In: 2005 27th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Vols. 1–7, pp. 3300–3303 (2005)
    16. Shang, Y., Hou, W.M., Wu, R.H., et al.: Antinoise rotation invariant texture classification based on LBP features of dominant curvelet subbands. In: 2008 2nd International Symposium on Intelligent Information Technology Application, pp. 365–369 (2008)
    17. Setia, L., Teynor, A., Halawani, A., et al.: Grayscale medical image annotation using local relational features. Pattern Recognit. Lett. 29(15), 2039–2045 (2008)
    18. Jin, H.L., Liu, Q.S., Lu, H.Q., et al.: Face detection using improved LBP under Bayesian framework. In: Proceedings of the 3rd International Conference on Image and Graphics, pp. 306–309 (2004). xvii+588
    19. Wang, Y., Wei, X.Y., Xiao, S.: LBP texture analysis based on the local adaptive Niblack algorithm. In: CISP 2008: Proceedings of the 1st International Congress on Image and Signal Processing, Vol. 2, pp. 777–780 (2008)
    20. Tian, G.D., Men, A.D.: An improved texture-based method for background subtraction using local binary patterns. In: Proceedings of the 2009 2nd International Congress on Image and Signal Processing, Vols. 1–9, pp. 1984–1987 (2009)
  • 作者单位:http://www.springerlink.com/content/64001611217h7557/
  • 刊物类别:Engineering
  • 刊物主题:Structural Mechanics
    Characterization and Evaluation Materials
    Vibration, Dynamical Systems and Control
    Mechanics
  • 出版者:Springer Netherlands
  • ISSN:1573-4862
文摘
The blurring of DR image often affects defect inspection. In this paper, a novel method called FLIT-LBP for the enhancement of blurry DR image is presented. The proposed method utilizes finite line integral transform (FLIT) to extract direction information, based on which appropriate weight arrangement can be chosen. Weight arrangement is a sorting order of weights that converts binary codes to decimal codes in local binary patterns (LBP). And the central pixel information is extracted by computing the mean value in LBP. By combining the direction extraction of FLIT and the local comparison of LBP, FLIT-LBP is able to enhance blurry defect images with different directions. Experimental results show that FLIT-LBP performs better than LBP and FLIT respectively. In addition, in the case of defects with different contrast ratios lying in the same image, our method achieves better enhancement than grayscale stretch does.

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