文摘
The blurring of DR image often affects defect inspection. In this paper, a novel method called FLIT-LBP for the enhancement of blurry DR image is presented. The proposed method utilizes finite line integral transform (FLIT) to extract direction information, based on which appropriate weight arrangement can be chosen. Weight arrangement is a sorting order of weights that converts binary codes to decimal codes in local binary patterns (LBP). And the central pixel information is extracted by computing the mean value in LBP. By combining the direction extraction of FLIT and the local comparison of LBP, FLIT-LBP is able to enhance blurry defect images with different directions. Experimental results show that FLIT-LBP performs better than LBP and FLIT respectively. In addition, in the case of defects with different contrast ratios lying in the same image, our method achieves better enhancement than grayscale stretch does.