A control chart for an exponential distribution using multiple dependent state sampling

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• 作者：Muhammad Aslam (1)
  Muhammad Azam (1)
  Nasrullah Khan (2)
  Chi-Hyuck Jun (3)
  
  1. Department of Statistics ; Forman Christian College University ; Lahore ; 54000 ; Pakistan
  2. Department of Statistics ; National College of Business Administration & Economics ; Lahore ; Pakistan
  3. Department of Industrial and Management Engineering ; POSTECH ; Pohang ; 790-784 ; Republic of Korea
  
• 关键词：t ; chart ; Multiple dependent sampling ; Average run length
• 刊名：Quality & Quantity
• 出版年：2015
• 出版时间：March 2015
• 年：2015
• 卷：49
• 期：2
• 页码：455-462
• 全文大小：131 KB
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  2. Aslam, M., Yen, C.-H., Chang, Chia-Hao, Jun, C.-H.: Multiple dependent state variables sampling plans with process loss consideration. Int. J. Adv. Manuf. Technol. doi:10.1007/s00170-013-5574-9
  3. Balamurali, S., Jun, C.-H.: Multiple dependent state sampling plans for lot acceptance based on measurement data. Eur. J. Oper. Res. 180, 1221鈥?230 (2007) 2006.05.025" target="_blank" title="It opens in new window">CrossRef
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• 刊物类别：Humanities, Social Sciences and Law
• 刊物主题：Social Sciences
  Methodology of the Social Sciences
  Social Sciences
  
• 出版者：Springer Netherlands
• ISSN：1573-7845

文摘

In this paper, we will present a control chart for exponentially distributed quality characteristics using multiple dependent state sampling. The proposed control chart has double control limits with two control coefficients, which is based on a normal approximation through transformation. The control coefficients are determined by considering the average run length (ARL) when the process is in control. The ARL for the shifted process is reported according to various shift ratios. The efficiency of the proposed control chart over the existing t-chart is compared in terms of the ARL.