Effect of Screen-Printing Mesh Opening Diameter on Microstructural and Electrical Properties of La0.6Sr0.4Co0.2Fe0.8Oclass="a
详细信息    查看全文
  • 作者:Atul P. Jamale ; C.H. Bhosale ; L.D. Jadhav
  • 关键词:Thick film ; screen printing ; microstructure ; electrical conductivity
  • 刊名:Journal of Electronic Materials
  • 出版年:2016
  • 出版时间:January 2016
  • 年:2016
  • 卷:45
  • 期:1
  • 页码:509-514
  • 全文大小:1,278 KB
  • 参考文献:1.K. Sundmacher, Ind. Eng. Chem. Res. 49, 10159 (2010).CrossRef
    2.W. Sun, X. Huang, Z. Lu, L. Zhao, B. Wei, S. Li, K. Chen, N. Ai, and W. Su, J. Phys. Chem. Solids 70, 164 (2009).CrossRef
    3.P. Datta, P. Majewski, and F. Aldinger, Mater. Chem. Phys. 107, 370 (2008).CrossRef
    4.D. Rembelski, J.P. Viricelle, L. Combemale, and M. Rieu, Fuel Cells 12, 256 (2012).CrossRef
    5.K. Swierczek and M. Gozu, J. Power Sources 173, 695 (2007).CrossRef
    6.S.H. Chan, X.J. Chen, and K.A. Khor, J. Electrochem. Soc. 151, A164 (2004).CrossRef
    7.J. Gerblinger, M. Hausner, and H. Meixner, J. Am. Ceram. Soc. 78, 1451 (1995).CrossRef
    8.C. Novone, M. Soulier, M. Plissonnier, and A.L. Seiller, J. Electron. Mater. 39, 1755 (2010).CrossRef
    9.A.P. Jamale, S.T. Jadhav, S.U. Dubal, C.H. Bhosale, and L.D. Jadhav, J. Phys. Chem. Solids 85, 96 (2015).CrossRef
    10.Y. Takizawa and D.D.L. Chung, J. Electron. Mater. 44, 2211 (2015).CrossRef
    11.S. Chen and R. Wang, Vacuum 85, 909 (2011).CrossRef
    12.T. Ryll, A. Brunner, S. Ellenbroek, A.B. Hutter, L.M. Jennifer, and L. Ruppa, J. Gauckler Phys. Chem. Chem. Phys. 12, 13933 (2010).CrossRef
    13.M.G. Rasteiro and E. Antunes, Part. Sci. Technol. 23, 361 (2005).CrossRef
    14.P. Ried, C. Lorenz, A. Bronstrup, T. Graule, N.H. Menzler, and W. Sitte, J. Eur. Ceram. Soc. 28, 1801 (2008).CrossRef
    15.K.L. Mendoza, A. Ortega, and N.S. Kimi, J. Electron. Mater. 44, 784 (2015).CrossRef
    16.G.E. Jabbour, R. Radspinner, and N. Peyghambarian, IEEE J. Sel. Top. Quantum Electron. 7, 769 (2001).CrossRef
    17.Y. Kim, K.H. Lee, T.H. Sung, S.C. Han, Y.H. Han, N.H. Jeong, and K. No, J. Electron. Mater. 36, 1252 (2007).CrossRef
    18.A.P. Jamale, S.U. Dubal, S.P. Patil, C.H. Bhosale, and L.D. Jadhav, Appl. Surf. Sci. 286, 78 (2013).CrossRef
    19.A. Zomorrodian, H. Salamati, Z. Lu, X. Chen, N. Wu, and A. Ignatiev, Int. J. Hydrogen Energy 35, 12443 (2010).CrossRef
    20.J.E. Elshof, H.J.M. Bouwmeester, and H. Verweij, Solid State Ion. 81, 97 (1995).CrossRef
  • 作者单位:Atul P. Jamale (1)
    C.H. Bhosale (1)
    L.D. Jadhav (2)

    1. Department of Physics, Shivaji University, Kolhapur, Maharashtra, 416004, India
    2. Electrochemical Energy Materials Laboratory, Department of Physics, Rajaram College, Kolhapur, Maharashtra, 416004, India
  • 刊物类别:Chemistry and Materials Science
  • 刊物主题:Chemistry
    Optical and Electronic Materials
    Characterization and Evaluation Materials
    Electronics, Microelectronics and Instrumentation
    Solid State Physics and Spectroscopy
  • 出版者:Springer Boston
  • ISSN:1543-186X
文摘
The performance of solid oxide fuel cells (SOFCs) is hampered by the large polarization and ohmic losses across the cathode–electrolyte interface. To minimize these losses, in most SOFCs the cathode is obtained by thick-film deposition techniques. Since the properties of such films depend upon the starting materials and screen-printing parameters, the effect of the mesh opening diameter on the physiochemical properties of cathodes for intermediate-temperature (IT)-SOFCs has been studied. Combustion-synthesized La0.6Sr0.4Co0.2Fe0.8O3−class="EmphasisTypeItalic ">δ powder with specific surface area of 11.64 m2 g−1 was utilized in film formation. All films were porous in nature, and the thickness was observed to increase with the mesh opening diameter. The electrical conductivity showed a decreasing trend with film thickness. Typically, film with 7 μm thickness showed moderate conductivity of 16.4 S cm−1 with E a = 0.1 eV.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700