Five-Parameter Grain Boundary Determination in Annealed Ferrite Structure Using Electron Backscatter Diffraction and Serial Sectioning Technique
详细信息    查看全文
文摘
The SEM/electron back scattered diffraction and serial sectioning procedure have been used to study the five parameter description of grain boundaries in a polygonal ferrite microstructure of 9Cr-1Mo steel. A routine has been evolved to correlate the successive images of a selected region and determine the grain boundary plane morphology. The relative misorientation of the crystallites, in terms of misorientation angle-axis (ω,ȓ), the grain boundary inclination angles [azimuth (γ) and polar (β) angles], and the crystallographic description of the two meeting planes have been studied and compared with random distribution. The low-angle boundaries are found to be persistently present in higher amounts after the grain growth induced by extended annealing.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700