Correlation Between Probe Shape and Atomic Friction Peaks at Graphite Step Edges

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• 作者：Yalin Dong (1)
  Xin Z. Liu (2)
  Philip Egberts (2)
  Zhijiang Ye (3)
  Robert W. Carpick (2)
  Ashlie Martini (3)
  
• 关键词：Molecular dynamics (MD) simulation ; Atomic force microscopy (AFM) ; Atomic friction
• 刊名：Tribology Letters
• 出版年：2013
• 出版时间：April 2013
• 年：2013
• 卷：50
• 期：1
• 页码：49-57
• 全文大小：718KB
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• 作者单位：Yalin Dong (1)
  Xin Z. Liu (2)
  Philip Egberts (2)
  Zhijiang Ye (3)
  Robert W. Carpick (2)
  Ashlie Martini (3)
  
  1. School of Mechanical Engineering, Purdue University, West Lafayette, IN, USA
  2. Department of Mechanical Engineering and Applied Mechanics, University of Pennsylvania, Philadelphia, PA, USA
  3. School of Engineering, University of California Merced, Merced, CA, USA
  
• ISSN：1573-2711

文摘

Molecular dynamics simulation and atomic force microscopy are used to study the nature of friction between nanoscale tips and graphite step edges. Both techniques show that the width of the lateral force peak as the probe moves up a step is directly correlated with the size and shape of the tip. The origin of that relationship is explored and the similarities and differences between the measurements and simulations are discussed. The observations suggest that the relationship between lateral force peak width and tip geometry can be used as a real-time monitor for tip wear during atomic scale friction measurements.