High-rate clock variations of the Galileo IOV-1/2 satellites and their impact on carrier tracking by geodetic receivers
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  • 作者:O. Montenbruck ; A. Hauschild ; S. Häberling ; B. Braun ; G. Katsigianni…
  • 关键词:Galileo ; Clock oscillation ; CMCU
  • 刊名:GPS Solutions
  • 出版年:2017
  • 出版时间:January 2017
  • 年:2017
  • 卷:21
  • 期:1
  • 页码:43-52
  • 全文大小:
  • 刊物类别:Earth and Environmental Science
  • 刊物主题:Geophysics/Geodesy; Atmospheric Sciences; Space Sciences (including Extraterrestrial Physics, Space Exploration and Astronautics); Automotive Engineering; Electrical Engineering;
  • 出版者:Springer Berlin Heidelberg
  • ISSN:1521-1886
  • 卷排序:21
文摘
The carrier signals of the first two Galileo satellites, IOV-1 and IOV-2, exhibit subtle phase variations, which may cause high-rate oscillations in carrier phase measurements of geodetic-grade receivers as well as associated Doppler measurement errors. The carrier phase oscillations slightly exceed the noise level of the measurements and have been attributed to a subtle cross talk of signals from two active atomic frequency standards in the clock monitoring and control unit (CMCU). This cross talk is only present in the first two IOV satellites, and its practical implications have partly been compensated by now through a suitable configuration of the CMCU. Nevertheless, a proper understanding of the phenomenon is deemed relevant to the interpretation of Galileo IOV measurements collected with global ground networks in the 2012 to early 2015 time frame. Also, the data collected so far offer valuable insight into the tracking of high-frequency signal variation of geodetic receivers that are of interest for applications such as structural monitoring or earthquake research. We present practical measurements from zero-baseline tests of common geodetic receivers with data rates of 1/30–1 Hz as well as dedicated tests with high-rate (50–100 Hz) receivers to evidence the phenomenon. Efforts are made to understand the different response of specific receivers based on generic receiver tracking and measurement generation concepts.

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