Thickness dependent optical dispersion parameters and nonlinear optical properties of nanostructured Cr doped CdO thin films

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• 作者：B. Hymavathi ; B. Rajesh Kumar ; T. Subba Rao
• 关键词：Thin films ; DC magnetron sputtering ; Dispersion parameters ; Dielectric constants ; Nonlinear refractive index
• 刊名：Optical and Quantum Electronics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：49
• 期：2
• 全文大小：
• 刊物主题：Optics, Lasers, Photonics, Optical Devices; Electrical Engineering; Characterization and Evaluation of Materials; Computer Communication Networks;
• 出版者：Springer US
• ISSN：1572-817X
• 卷排序：49

文摘

Cr doped CdO thin films were deposited on glass substrates by reactive DC magnetron sputtering with varying film thickness from 250 to 400 nm. XRD studies reveal that the films exhibit cubic structure with preferred orientation along the (2 0 0) plane. The optical transmittance of the films decreases from 92 to 72%, whereas the optical energy band gap of the films decreased from 2.88 to 2.78 eV with increasing film thickness. The Wemple–DiDomenico single oscillator model has been used to evaluate the optical dispersion parameters such as dispersion energy (E_d), oscillator energy (E_o), static refractive index (n_o) and high frequency dielectric constant (ε_∞). The nonlinear optical parameters such as optical susceptibility (χ(1)), third order nonlinear optical susceptibility (χ(3)) and nonlinear refractive index (n₂) of the films were also determined.