X-ray fluorescence analytical signal of elements with small atomic numbers as a function of the energy of primary photons

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• 作者：G. V. Pavlinskii
• 关键词：X ; ray fluorescence ; ionization by primary photons ; photo and Auger electrons ; incoherent scattering ; Compton recoil electrons
• 刊名：Journal of Analytical Chemistry
• 出版年：2016
• 出版时间：January 2016
• 年：2016
• 卷：71
• 期：1
• 页码：22-26
• 全文大小：274 KB
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• 作者单位：G. V. Pavlinskii (1)
  
  1. Faculty of Physics, Irkutsk State University, bulv. Gagarina 20, Irkutsk, 664003, Russia
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Analytical Chemistry
  Russian Library of Science
  
• 出版者：MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
• ISSN：1608-3199

文摘

The dependence of the intensity of X-ray fluorescence on the energy of photons exciting X-ray radiation is considered. For elements with small atomic numbers, the direct ionization of atoms, the major process for the majority of elements of the Periodic Table, is the main only at low energies of primary photons. With the growth of photon energy, the intensity of fluorescence due to photo and Auger electrons arising in the irradiated material increases. This component at certain energy becomes predominant. The further increase in the energy of primary photons leads to the suppression of the ionization of atoms by recoil electron arising in the incoherent (Compton) scattering of primary radiation. The effects of the energy of primary photons on the intensity of X-ray fluorescence for the studied processes differ significantly. The depth of these effects determines their contributions to the formation of the analytical signal. Study of the influence of excitation conditions allows the analyst to intelligently solve problems of the optimization of the X-ray fluorescence determination of elements with small atomic numbers. Keywords X-ray fluorescence ionization by primary photons photo and Auger electrons incoherent scattering Compton recoil electrons