Monte Carlo study of non-quasiequilibrium carrier dynamics in III–N LEDs
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  • 作者:Pyry Kivisaari ; Toufik Sadi ; Jani Oksanen ; Jukka Tulkki
  • 关键词:III–Nitride LEDs ; Monte Carlo simulations ; Hot carriers ; Non ; equilibrium hole distribution
  • 刊名:Optical and Quantum Electronics
  • 出版年:2016
  • 出版时间:February 2016
  • 年:2016
  • 卷:48
  • 期:2
  • 全文大小:409 KB
  • 参考文献:Bertazzi, F., Goano, M., Zhou, X., Calciati, M., Ghione, G., Matsubara, M., Bellotti, E.: Looking for Auger signatures in III–nitride light emitters: a full-band Monte Carlo perspective. Appl. Phys. Lett. 106, 061112 (2015)CrossRef ADS
    Binder, M., Nirschl, A., Zeisel, R., Hager, T., Lugauer, H.-J., Sabathil, M., Bougeard, D., Wagner, J., Galler, B.: Identification of nnp and npp Auger recombination as significant contributor to the efficiency droop in (GaIn)N quantum wells by visualization of hot carriers in photoluminescence. Appl. Phys. Lett. 103, 071108 (2013)CrossRef ADS
    Deppner, M., Römer, F., Witzigmann, B.: Auger carrier leakage in III–nitride quantum-well light emitting diodes. Phys. Status Solidi RRL 6, 418–420 (2012)CrossRef
    Heikkilä, O., Oksanen, J., Tulkki, J.: Ultimate limit and temperature dependency of light-emitting diode efficiency. J. Appl. Phys. 105, 093119 (2009)CrossRef ADS
    Iveland, J., Piccardo, M., Martinelli, L., Peretti, J., Choi, J.W., Young, N., Nakamura, S., Speck, J.S., Weisbuch, C.: Origin of electrons emitted into vacuum from InGaN light emitting diodes. Appl. Phys. Lett. 105, 052103 (2014)CrossRef ADS
    Jacoboni, C., Reggiani, L.: The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials. Rev. Mod. Phys. 55, 645 (1983)CrossRef ADS
    Kivisaari, P., Oksanen, J., Tulkki, J.: Polarization doping and the efficiency of III–nitride optoelectronic devices. Appl. Phys. Lett. 103, 211118 (2013)CrossRef ADS
    Kivisaari, P., Oksanen, J., Tulkki, J., Sadi, T.: Monte Carlo simulation of hot carrier transport in III–N LEDs. J. Comput. Electron. 14, 382–397 (2015)CrossRef
    Kivisaari, P., Oksanen, J., Tulkki, J., Sadi, T.: Bipolar Monte Carlo simulation of electrons and holes in III–N LEDs. Proc. SPIE 9363, 93631S (2015)CrossRef
    Li, Z.M.S.: Non-local transport in numerical simulation of GaN LED. J. Comput. Electron. 14, 409–415 (2015)CrossRef
    Nakamura, S., Krames, M.: History of Gallium–Nitride-based light-emitting diodes for illumination. Proc. IEEE 101, 2211–2220 (2013)CrossRef
    Piprek, J.: How to decide between competing efficiency droop models for GaN-based light-emitting diodes. Appl. Phys. Lett. 107, 031101 (2015)CrossRef ADS
    Piprek, J., Römer, F., Witzigmann, B.: On the uncertainty of the Auger recombination coefficient extracted from InGaN/GaN light-emitting diode efficiency droop measurements. Appl. Phys. Lett. 106, 101101 (2015)CrossRef ADS
    Römer, F., Witzigmann, B.: Acceptor impurity activation in III–nitride light emitting diodes. Appl. Phys. Lett. 106, 021107 (2015)CrossRef ADS
    Ridley, B.K.: Quantum Processes in Semiconductors. Clarendon Press, Oxford (1999)
    Sadi, T., Kelsall, R.W., Pilgrim, N.J.: Investigation of self-heating effects in submicrometer GaN/AlGaN HEMTs using an electrothermal Monte Carlo method. IEEE Trans. Electron. Dev. 53, 2892–2900 (2006)CrossRef ADS
    Sadi, T., Kelsall, R.W.: Hot-phonon effect on the electrothermal behavior of submicrometer III–V HEMTs. IEEE Electron. Device Lett. 28, 787–789 (2007)CrossRef ADS
    Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: On the correlation of the Auger generated hot electron emission and efficiency droop in III–N light-emitting diodes. Appl. Phys. Lett. 105, 091106 (2014)CrossRef ADS
    Sadi, T., Kivisaari, P., Oksanen, J., Tulkki, J.: Microscopic simulation of hot electron transport in III–N light-emitting diodes. Opt. Quantum Electron. 47, 1509–1518 (2015)CrossRef
    Yang, T.-J., Shivaraman, R., Speck, J.S., Wu, Y.-R.: The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior. J. Appl. Phys. 116, 113104 (2014)CrossRef ADS
  • 作者单位:Pyry Kivisaari (1)
    Toufik Sadi (2)
    Jani Oksanen (3)
    Jukka Tulkki (3)

    1. Division of Solid State Physics, Lund University, Lund, Sweden
    2. School of Engineering, University of Glasgow, Glasgow, UK
    3. School of Science, Aalto University, Espoo, Finland
  • 刊物主题:Optics, Optoelectronics, Plasmonics and Optical Devices; Electrical Engineering; Characterization and Evaluation of Materials; Computer Communication Networks;
  • 出版者:Springer US
  • ISSN:1572-817X
文摘
Hot carrier effects have been observed in recent measurements of III–Nitride (III–N) light-emitting diodes. In this paper we carry out bipolar Monte Carlo simulations for electrons and holes in a typical III–N multi-quantum well (MQW) LED. According to our simulations, significant non-quasiequilibrium carrier distributions exist in the barrier layers of the structure. This is observed as average carrier energies much larger than the \(1.5k_BT\) corresponding to quasi-equilibrium. Due to the small potential drop over the MQW being modest, the non-quasiequilibrium carriers can be predominantly ascribed to nnp and npp Auger processes taking place in the QWs. Further investigations are needed to determine the effects of hot carriers on the macroscopic device characteristics of real devices.

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