Influence of Sn⁴⁺ on Structural and DC Electrical Resistivity of Ni-Zn Ferrite Thick Films

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• 作者：S. P. Dalawai ; T. J. Shinde ; A. B. Gadkari ; N. L. Tarwal…
• 关键词：Ni ; Zn ; Sn ferrites ; structural properties ; DC electrical resistivity ; screen printing technique ; ferrite thick films
• 刊名：Journal of Electronic Materials
• 出版年：2017
• 出版时间：March 2017
• 年：2017
• 卷：46
• 期：3
• 页码：1427-1438
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Optical and Electronic Materials; Characterization and Evaluation of Materials; Electronics and Microelectronics, Instrumentation; Solid State Physics;
• 出版者：Springer US
• ISSN：1543-186X
• 卷排序：46

文摘

Among the soft ferrites, Ni-Zn ferrite is one of the most versatile ceramic materials because of their important electrical and magnetic properties. These properties were improved by substituting Sn4+ in Ni-Zn ferrites with chemical composition of Nib>xb>Znb>1+y−xb>Feb>2−2yb>Snb>yb>Ob>4b> (x = 0, 0.2, 0.4, 0.6, 0.8, 1.0; y = 0.1, 0.2). To achieve homogenous ferrite powder at lower sintering temperature and smaller duration in nano-size form, the oxalate co-precipitation method was preferred as compared to other physical and chemical methods. Using this powder, ferrite thick films (FTFs) were prepared by the screen printing technique because of its low cost and easy use. To study structural behavior, the FTFs were characterized by different techniques. The x-ray diffraction and thermo-gravimetric and differential thermal analysis studies show the formation of cubic spinel structure and ferrite phase formation, respectively. There is no remarkable trend observed in lattice constants for the Sn4+ (y = 0.1)- and Sn4+ (y = 0.2)-substituted Ni-Zn ferrites. The bond lengths as well as ionic radii on the A-site of Ni-Zn-Sn ferrites were found to decrease with increasing nickel content. The bond length and ionic radii on the B-sites remained almost constant for Sn4+ (y = 0.1, 0.2)-substituted Ni-Zn ferrites. The energy dispersive x-ray analysis confirms the elemental analysis of FTFs. The Fourier transform infrared spectra show two major absorption bands near 400 cm−1 and 600 cm−1 corresponding to octahedral and tetrahedral sites, respectively, which also confirms the formation of the ferrites. The field emission scanning electron microscopy images shows that the particles are highly porous in nature and located in loosely packed agglomerates. The average particle size of the FTFs lies in the range 20–60 nm. Direct current (DC) resistivity of Ni-Zn-Sn FTFs shows the semiconductor nature. The DC resistivity of Ni-Zn-Snb>0.2b>FTFs is lower than Ni-Zn-Snb>0.1b> FTFs. The DC resistivity is found to decrease with the increase in Ni2+ content up to x = 0.6. It increases thereafter for a further increase in Ni2+ content up to x = 1.0, and a similar trend is observed for the variations of activation energy with Ni2+ content.