Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding

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• 作者：Haiying Yuan ; Zijian Ju ; Xun Sun ; Kun Guo ; Xiuyu Wang
• 关键词：Pattern run ; length coding ; System ; on ; a ; chip ; Test data compression ; Flexible runs ; aware ; Compatible segment
• 刊名：Journal of Electronic Testing
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：32
• 期：5
• 页码：639-647
• 全文大小：1,003 KB
• 刊物类别：Engineering
• 刊物主题：Circuits and Systems
  Electronic and Computer Engineering
  Computer-Aided Engineering and Design
  
• 出版者：Springer Netherlands
• ISSN：1573-0727
• 卷排序：32

文摘

This paper presents a flexible runs-aware PRL coding method whose coding algorithm is simple and easy to implement. The internal 2-n-PRL coding iteratively codes 2n runs of compatible or inversely compatible patterns inside a single segment. The external N-PRL coding iteratively codes flexible runs of compatible or inversely compatible segments across multiple segments. The decoder architecture is concise. The benchmark circuits verify the flexible runs-aware PRL coding method, the experimental results show it obtains higher compression ratio and shorter test application time.