Temperature-dependent photoluminescence of ZnO thin films deposited by using the sol-gel dip-coating method
详细信息    查看全文
  • 作者:Sang-heon Lee (1)
    Wonshoup So (1)
    Jae Hak Jung (1)
    Giwoong Nam (2)
    Hyunsik Yoon (2)
    Hyunggil Park (2)
    Kyeong Min Kim (2)
    Soaram Kim (3)
    Min Su Kim (3)
    Jewon Lee (3)
    Jae-Young Leem (3)
  • 关键词:II–VI ; Luminescence ; Scanning electron microscopy
  • 刊名:Journal of the Korean Physical Society
  • 出版年:2012
  • 出版时间:October 2012
  • 年:2012
  • 卷:61
  • 期:8
  • 页码:1171-1176
  • 全文大小:307KB
  • 参考文献:1. C. Klingshirn, Phys. Status Solidi B 244, 3027 (2007). CrossRef
    2. Y. R. Ryu, S. Zhu, J. D. Budai, H. R. Chandrasekhar, P. F. Miceli and H. W. White, J. Appl. Phys. 88, 201 (2000). CrossRef
    3. F. K. Shan, B. C. Shin, S. C. Kim and Y. S. Yu, J. Eur. Ceram. Soc. 24, 1861 (2004). CrossRef
    4. Y. F. Lu, H. Q. Ni, Z. H. Ni, Z. H. Mai and Z. M. Ren, J. Appl. Phys. 88, 498 (2000). CrossRef
    5. C. F. Klingshirn, / Semiconductor Optics, 2nd ed. (Springer, Berlin, 1995).
    6. W. S. Shi, O. Agyeman and C. N. Xu, J. Appl. Phys. 91, 5640 (2002). CrossRef
    7. Th. Gruber, C. Kirchner, K. Thonke, R. Sauer and A. Waag, Phys. Status Solidi A 192, 166 (2002). CrossRef
    8. J. Wang, Q. Yang, Z. Zhuangzhi, G. Jing, L. Maolin, Z. Ying, Smart Mater. Struct. 16, 2673 (2007). CrossRef
    9. L. Yaoming, X. Linhua, L. Xiangyin, S. Xingquan and W. Ailing, Appl. Surf. Sci. 256, 4543 (2010). CrossRef
    10. T. Schuler and M. A. Aegerter, Thin Solid Films 351, 125 (1999). CrossRef
    11. J. F. Cordaro, Y. Shim and J. E. May, J. Appl. Phys. 60, 4186 (1986). CrossRef
    12. V. Srikant and D. R. Clarke, J. Appl. Phys. 83, 5447 (1998). CrossRef
    13. S. Goldsmith, Surf. Coat. Technol. 201, 3993 (2006). CrossRef
    14. A. Sarkar, M. Chakrabarti, D. Sanyal, D. Bhowmick, S. Dechoudhury, A. Chakrabarti, T. Rakshit and S. K. Ray, J. Phys. Condens. Matter 24, 325503 (2012). CrossRef
    15. Y. Chen, F. Jiang, L. Wang, C. Zheng, J. Dai, Y. Pu and W. Fang, J. Cryst. Growth 275, 486 (2005). CrossRef
    16. K. Kitamura, T. Yatsui, M. Ohtsu and G.-C. Yi, Nanotechnology 19, 175305 (2008). CrossRef
    17. T.-W Kim, T. Kawazoe, S. Yamazaki, J. Lim, T. Yarsui and M. Ohtsu, Solid State Commun. 12, 21 (2003). CrossRef
    18. X. H. Pan, J. Jiang, Y. J. Zeng, H. P. He, L. P. Zhu, Z. Z. Ye, B. H. Zhao and X. Q. Pan, J. Appl. Phys. 103, 023708 (2008). CrossRef
    19. M. N. Jung, S. H. Park, S. Y. Ha, S. J. Oh, Y. R. Cho, J. S. Park, I. H. Im, B. H. Koo, T. Yao and J. H. Chang, Physica E 40, 2761 (2008). CrossRef
    20. S. Zhong, W.-Y. Zhang, X.-P. Wu, B.-X. Lin and Z.-X. Fu, Chin. Phys. Lett. 25, 2585 (2008). CrossRef
    21. S. C. Su, Y. M. Lu, G. Z. Xing and T. Wu, Superlattices Microstruct. 48, 485 (2010). CrossRef
    22. J. Gao, X. Zhang, Y. Sun, Q. Zhao and D. Yu, Nanotechnology 21, 245703 (2010). CrossRef
    23. A. Zeuner, H. Alves, D. M. Hofmann, B. K. Meyer, A. Hoffmann, U. Haboeck, M. Strassburg and M. Dworzak, Phys. Status Solidi B 234, R7 (2002). CrossRef
    24. B. Zhang, B. Yao, S. Wang, Y. Li, C. Shan, J. Zhang, B. Li, Z. Zhang and D. Shen, J. Alloys Compd. 503, 155 (2010). CrossRef
    25. U. Ozgur, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Dogan, V. Avrutin, S.-J. Cho and H. Morkoc, J. Appl. Phys. 98, 041301 (2005). CrossRef
    26. X. Q. Xu, B. X. Lin, L. J. Sun and Z. X. Fu, J. Phys. D: Appl. Phys. 42, 085102 (2009). CrossRef
    27. A. Teke, U. Ozgur, S. Dogan, X. Gu and H. Morkoc, Phys. Rev. B 70, 195207 (2004). CrossRef
    28. F. Z. Wang, H. P. He, Z. Z. Ye and L. P. Zhu, J. Appl. Phys. 98, 084301 (2005). CrossRef
    29. Y. Cho, G. H. Gainer, A. J. Fischer, J. J. Song, S. Keller, U. K. Mishra and S. P. DenBaars, Appl. Phys. Lett. 73, 1370 (1998). CrossRef
    30. Y. P. Varshni, Physica 34, 149 (1967). CrossRef
    31. X. D. Yang, Z. Y. Xu, Z. Sun, B. Q. Sun, L. Ding, F. Z. Wang and Z. Z. Ye, J. Appl. Phys. 99, 046101 (2006). CrossRef
    32. A. Zeunder, D. M. Hofmann, B. K. Meyer, M. Heuken, J. B?lsing and A. Krost, Appl. Phys. Lett. 80, 2078 (2002). CrossRef
    33. G. W. ’t Hooft, W. A. J. A. van der Poel and L. W. Molenkamp, Phys. Rev. B 35, 8281 (1987). CrossRef
    34. J. Feldmann, G. Peter, E. O. Gobel, P. Dawson, K. Moore, C. Foxon and R. J. Elliott, Phys. Rev. Lett. 59, 2337 (1987). CrossRef
    35. S.-K. Lee, S. L. Chen, D. Hongxing, L. Sun, Z. Chen, W. M. Chen and I. A. Buyanova, Appl. Phys. Lett. 96, 083104 (2010). CrossRef
    36. R. Hellmann, M. Koch, J. Feldmann, S. T. Lundiff, E. O. Gobel, D. R. Yakovler, A. Waag and G. Landwehr, Phys. Rev. B 48, 2847 (1993). CrossRef
    37. M. O’Neill, M. Oestriech, W. W. Ruhle and D. E. Ashenford, Phys. Rev. B 48, 8980 (1993). CrossRef
  • 作者单位:Sang-heon Lee (1)
    Wonshoup So (1)
    Jae Hak Jung (1)
    Giwoong Nam (2)
    Hyunsik Yoon (2)
    Hyunggil Park (2)
    Kyeong Min Kim (2)
    Soaram Kim (3)
    Min Su Kim (3)
    Jewon Lee (3)
    Jae-Young Leem (3)

    1. School of Chemical Engineering, Yeungnam University, Gyeongsan, 712-749, Korea
    2. Department of Nano Engineering, Inje University, Gimhae, 621-749, Korea
    3. Department of Nano Systems Engineering, Center for Nano Manufacturing, Inje University, Gimhae, 621-749, Korea
  • ISSN:1976-8524
文摘
The sol-gel dip-coating method is a simple and inexpensive technique compared to molecular beam epitaxy and chemical vapor deposition. In spite of extensive research over the past several years, the temperature-dependent photoluminescence in ZnO is still not fully understood. The temperaturedependent PL of ZnO thin films grown on quartz substrate by using the dip-coating method are investigated. According to Haynes-empirical rule, the peak at 3.320 eV could be attributed to two electron satellites (TES). Theoretically, the radiative lifetime of the free excitons increases with temperature. The full width at half maximum (FWHM) is theoretically fitted by the experimental data. In the case of exciton-LO phonon coupling, the FWHM value of the donor-acceptor pair (DAP) is larger than that of the free-to-neutral-acceptor (e,A0). In the case of the exciton-acoustic-phonon coupling strength, however, the value of the DAP is smaller than that of the (e,A0).

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700