Scaling behavior of ZnPc thin films grown on CuI interlayers
详细信息 查看全文
- 作者：Jinho Lee ; Sung-Il Jin ; Chan Ryang Park ; Sanggyu Yim
- 关键词：ZnPc ; CuI ; thin film growth ; height difference correlation function ; atomic force microscopy
- 刊名：Electronic Materials Letters
- 出版年：2015
- 出版时间：January 2015
- 年：2015
- 卷：11
- 期：1
- 页码：113-117
- 全文大小：774 KB
- 参考文献：1. C. H. Cheng, J. Wang, G. T. Du, S. H. Shi, Z. J. Du, Z. Q. Fan, J. M. Bian, and M. S. Wang, / Appl. Phys. Lett. 97, 083305 (2010).
2. Y. Zhou, T. Taima, T. Miyadera, T. Yamanari, M. Kitamura, K. Nakatsu, and Y. Yoshida, / Appl. Phys. Lett. 100, 233302 (2012). CrossRef
3. J. Lee, D. Park, I. Heo, and S. Yim, / Mater. Res. Bull. 58, 132 (2014). CrossRef
4. I. S. Oh, G. M. Kim, S. H. Han, and S. Y. Oh, / Electron. Mater. Lett. 9, 375 (2013). CrossRef
5. S. Ochiai, P. Kumar, K. Santhakumar, and P.-K. Shin, / Electron. Mater. Lett. 9, 399 (2013). CrossRef
6. O. Guskova, C. Schunemann, K. J. Eichhom, K. Walzer, M. Levichkova, S. Grundmann, and J. U. Sommer, / J. Phys. Chem. C 117, 17285 (2013). CrossRef
7. S. Kawata, Y. J. Pu, C. Ohashi, K. Nakayama, Z. Hong, and J. Kido, / J. Mater. Chem. C 2, 201 (2014). CrossRef
8. K. H. Kim, H. Yu, H. Kang, D. J. Kang, C. H. Cho, H. H. Cho, J. H. Oh, and B. J. Kim, / J. Mater. Chem. A 1, 14538 (2013). CrossRef
9. K. S. Yook, B. D. Chin, J. Y. Lee, B. E. Lassiter, and S. R. Forrest, / Appl. Phys. Lett. 99, 043308 (2011).
10. S. Yim, S. Heutz, and T. S. Jones, / J. Appl. Phys. 91, 3632 (2002). CrossRef
11. D. Hong, Y. R. Do, H. T. Kwak, and S. Yim, / J. Appl. Phys. 109, 063507 (2011).
12. S. Yim, K.-I. Kim, and T. S. Jones, / J. Phys. Chem. C 111, 10993 (2007). CrossRef
13. H. Gong and S. Yim, / Bull. Kor. Chem. Soc. 32, 2237 (2011). CrossRef
14. J. Krug, / Adv. Phys. 46, 139 (1997). CrossRef
15. A. L. Barabasi and H. E. Stanley, / Fractal Concepts in Surface Growth, Cambridge University Press (1995). CrossRef
16. S. Yim and T. S. Jones, / Phys. Rev. B 73, 161305 (2006). CrossRef
17. G. Palasantzas and J. Krim, / Phys. Rev. B 48, 2873 (1993). CrossRef
18. A. C. Dürr, F. Schreiber, K. A. Ritley, V. Kruppa, J. Krug, H. Dosch, and B. Struth, / Phys. Rev. Lett. 90, 016104 (2003).
19. Y.-P. Zhao, J. B. Fortin, G. Bonvallet, G.-C. Wang, and T.-M. Lu, / Phys. Rev. Lett. 85, 3229 (2000). CrossRef
20. G. W. Collins, S. A. Letts, E. M. Fearon, R. L. McEachern, and T. P. Bernat, / Phys. Rev. Lett. 73, 708 (1994). CrossRef
21. J. Kim, N. Lim, C. R. Park, and S. Yim, / Surf. Sci. 604, 1143 (2010). Cros - 刊物类别：Chemistry and Materials Science
- 刊物主题：Condensed Matter Physics
Electronics, Microelectronics and Instrumentation
Optical and Electronic Materials
Thermodynamics
Characterization and Evaluation of Materials - 出版者：The Korean Institute of Metals and Materials, co-published with Springer Netherlands
- ISSN：2093-6788
文摘
The growth behavior and consequent surface morphology evolution of zinc phthalocyanine (ZnPc) thin films deposited on a CuI interlayer were studied using atomic force microscopy and height difference correlation function (HDCF) analysis. The planar phthalocyanine thin films grown on non-interacting substrates have previously been reported to show anomalous scaling behavior such as large growth exponents, ?, sometimes larger than 0.5, and small anomaly values, ρ, typically smaller than 0.6. In contrast, ZnPc thin films on a CuI interlayer (CuI/ ZnPc) in this work showed conventional scaling behavior with a ? value of 0.26 ± 0.05 and a ρ value of 0.91. The HDCF analyses and x-ray diffraction results indicate that the expected interdigitated electron donor-acceptor interface was hardly formed for the CuI/ZnPc thin film system due to the lack of surface-parallel crystallites with high step edge barriers.