Optimization of planar reflector systems for a set of quality indices
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  • 作者:S. E. Bankov (1)
    V. A. Kaloshin (1)
    E. V. Frolova (1)
  • 刊名:Journal of Communications Technology and Electronics
  • 出版年:2014
  • 出版时间:November 2014
  • 年:2014
  • 卷:59
  • 期:11
  • 页码:1135-1146
  • 全文大小:1,006 KB
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  • 作者单位:S. E. Bankov (1)
    V. A. Kaloshin (1)
    E. V. Frolova (1)

    1. Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, ul. Mokhovaya 11, str. 7, Moscow, 125009, Russia
  • ISSN:1555-6557
文摘
Characteristics of a planar double-reflector aplanatic Schwarzschild system that allow estimation of the efficiency of its application in devices of integrated microwave optics are analyzed. The results of multicriteria optimization of the system’s quality indices are obtained. The aplanatic system is compared to systems with parabolic reflectors: a single-reflector system and a double-reflector system with flat subreflector. It is shown that the results of optimization obtained in the approximation of physical optics agree well with the results of the analysis and minimization of aberrations in the reflector system performed with the use of the proposed criterion of rms aberrations. Scanning characteristics of Pareto-optimal planar aplanats are presented.

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