x ,Ga x )Se2 (CIGS) solar cell devices on two different substrates with different Na levels. The effect of Na from the glass substrates on the CIGS device performance was investigated. We found clear evidence of performance enhancement due to Na especially for samples grown at higher temperatures. A comparison of the secondary ion mass spectroscopy (SIMS) profiles indicated the additional presence of alkali K atoms for devices on photovoltaic (PV)-specialty glass substrates. Novel reverse-bias-induced breakdown measurements were carried out to quantitatively characterize the quality of the junction interface due to the level of Na out-diffusion at higher growth temperatures." />
The effect of Na on CIGS module performance
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  • 作者:JinWoo Lee (1)
    ChulHwan Choi (1)
    KyoungHo Kang (1)
    MinJung Shin (1)
    SeHan Kwon (1)
    Jae Ho Yun (2)
  • 关键词:CIGS ; Na ; K ; Interface ; Defect ; Breakdown
  • 刊名:Journal of the Korean Physical Society
  • 出版年:2012
  • 出版时间:June 2012
  • 年:2012
  • 卷:60
  • 期:12
  • 页码:1997-2000
  • 全文大小:364KB
  • 参考文献:1. M. Lammer, A. Eicke and M. Powalla, Thin Solid Films 451, 175 (2004). CrossRef
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    9. J. K. J. van Duren, C. Leidholm, A. Pudov, M. R. Robinson and Y. Roussillon, Mater. Res. Soc. Symp. Proc. 1012, Y05 (2007).
    10. A. Yamada, K. Matsubara, K. Sakurai, S. Ishizuka, H. Tampo, H. Shibata, T. Baba, Y. Kimura, S. Nakamura, H. Nakanishi and S. Niki, Mater. Res. Soc. Symp. Proc. 865, F5.19.1 (2005). CrossRef
  • 作者单位:JinWoo Lee (1)
    ChulHwan Choi (1)
    KyoungHo Kang (1)
    MinJung Shin (1)
    SeHan Kwon (1)
    Jae Ho Yun (2)

    1. Solar Cell Business Team, LG Innotek, Osan, 447-705, Korea
    2. Korea Institute of Energy Research, Daejeon, 305-343, Korea
  • ISSN:1976-8524
文摘
We fabricated matched pairs of Cu(In1?em class="a-plus-plus">x ,Ga x )Se2 (CIGS) solar cell devices on two different substrates with different Na levels. The effect of Na from the glass substrates on the CIGS device performance was investigated. We found clear evidence of performance enhancement due to Na especially for samples grown at higher temperatures. A comparison of the secondary ion mass spectroscopy (SIMS) profiles indicated the additional presence of alkali K atoms for devices on photovoltaic (PV)-specialty glass substrates. Novel reverse-bias-induced breakdown measurements were carried out to quantitatively characterize the quality of the junction interface due to the level of Na out-diffusion at higher growth temperatures.

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