Highlighting the distribution path of transient disturbances by near field scanning techniques

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• 作者：Bernd Deutschmann ; Sandra Schindlbacher…
• 关键词：surface scan ; near field scanning ; electrostatic discharge ; transient disturbances ; electromagnetic compatibility ; EMC ; ESD
• 刊名：e & i Elektrotechnik und Informationstechnik
• 出版年：2016
• 出版时间：February 2016
• 年：2016
• 卷：133
• 期：1
• 页码：18-24
• 全文大小：3,296 KB
• 参考文献：1. Slattery, K., Cui, W. (1999): Measuring the electric and magnetic near fields in VLSI devices. In Proc. IEEE international symposium on electromagnetic compatibility, Seattle, August (pp. 887–892).
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  3. EMScan, EMxpert. Canada, http://​www.​emscan.​com/​ .
  4. Langer EMV-Technik, PCB-scanner FLS106-PCB. Germany, http://​www.​langer-emv.​de .
  5. Speag, ICEy—interference & compatibility evaluation system. Switzerland, http://​www.​speag.​com .
  6. IEC TS 61967-3:2014 (2014): Integrated circuits—measurement of electromagnetic emissions, part 3: measurement of radiated emissions—surface scan method. Edition 2.0, 2014-08-25, www.​iec.​ch .
  7. Dong, X., Deng, S., Hubing, T., Beetner, D. (2004): Analysis of chip-level EMI using near-field magnetic scanning. In Proc. international symposium on electromagnetic compatibility, EMC 2004 (Vol. 1, pp. 174–177).
  8. Deutschmann, B., Jungreithmair, J. (2003): Visualizing the electromagnetic emission at the surface of ICs. In Proc. IEEE international symposium on electromagnetic compatibility (Vol. 2, pp. 1125–1128).
  9. Ordas, T., et al. (2008): Nearfeld mapping system to scan in time domain the magnetic emissions of integrated circuits. In International workshop on power and timing modeling optimization and simulation, PAT-MOS’08 (pp. 229–236).
  10. IEC 61000-4-2:2008 (2008): Electromagnetic compatibility (EMC), part 4-2: testing and measurement techniques—electrostatic discharge immunity test, TC 77/SC 77B—high frequency phenomena. www.​iec.​ch , 2008-12-09.
  
• 作者单位：Bernd Deutschmann (1)
  Sandra Schindlbacher (1)
  Gunter Winkler (1)
  
  1. Institute of Electronics, Graz University of Technology, Inffeldgasse 12/I, 8010, Graz, Austria
  
• 刊物类别：Engineering
• 刊物主题：Electronic and Computer Engineering
  Computer Hardware
  Software Engineering, Programming and Operating Systems
  
• 出版者：Springer Wien
• ISSN：1613-7620

文摘

Many different measurement techniques are currently available to characterize the electromagnetic compatibility of electronic devices and systems. One of these techniques is known as the so-called “Surface Scan Method”. It is based on a near-field scanning technique and enables the visualization of the distribution of magnetic near field being present at the surface of printed circuit boards (PCBs). This technique provides an efficient way to find the sources of electromagnetic emission problems, as it can be used to pinpoint areas on the PCB which are usually the sources of the electromagnetic emission. In this paper it will be shown how such a surface scan technique can additionally be used to visualize the distribution path of transient disturbance currents. Such current surges can be caused by touching the PCB and thereby causing an electrostatic discharge directly into e.g. the connectors of the PCB.