Ion beam analysis of elemental signatures in uranium dioxide samples: importance for nuclear forensics

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• 作者：A. I. Apostol ; A. Pantelica ; I. Ortega-Feliu…
• 关键词：Nuclear forensics ; Uranium ; Metallic impurities ; IBA ; Gamma spectrometry
• 刊名：Journal of Radioanalytical and Nuclear Chemistry
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：311
• 期：2
• 页码：1339-1346
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Nuclear Chemistry; Physical Chemistry; Nuclear Physics, Heavy Ions, Hadrons; Diagnostic Radiology; Inorganic Chemistry;
• 出版者：Springer Netherlands
• ISSN：1588-2780
• 卷排序：311

文摘

In this paper the suitability of two non-destructive analytical techniques for identification of elemental signatures in samples containing uranium of different enrichments was studied. The measurements were based on particle induced X-ray emission (PIXE) and particle induced gamma-ray emission (PIGE) methods. The samples were irradiated by 3 and 5 MeV protons at the 3 MV Tandetron™ of Horia Hulubei National Institute for Physics and Nuclear Engineering. The characteristic X and gamma rays were measured using high purity germanium (HPGe) detectors. The GUPIX software was applied for processing the PIXE spectra, while a relative standardization was applied for PIGE analysis by using certified comparator standards and proton stopping powers calculated by SRIM.