Automated analysis of evolving interfaces during in situ electron microscopy

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• 作者：Nicholas M. Schneider ; Jeung Hun Park…
• 关键词：(10 max) ; In situ ; Electron microscopy ; Image analysis ; Liquid cell electron microscopy ; Interface tracking ; Growth dynamics ; Processes ; Edge detection
• 刊名：Advanced Structural and Chemical Imaging
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：2
• 期：1
• 全文大小：2,380 KB
• 刊物类别：Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Biological Microscopy;
• 刊物主题：Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Biological Microscopy;
• 出版者：Springer International Publishing
• ISSN：2198-0926

文摘

In situ electron microscopy allows one to monitor dynamical processes at high spatial and temporal resolution. This produces large quantities of data, and hence automated image processing algorithms are needed to extract useful quantitative measures of the observed phenomena. In this work, we outline an image processing workflow for the analysis of evolving interfaces imaged during liquid cell electron microscopy. As examples, we show metal electrodeposition at electrode surfaces; beam-induced nanocrystal formation and dissolution; and beam-induced bubble nucleation, growth, and migration. These experiments are used to demonstrate a fully automated workflow for the extraction of, among other things, interface position, roughness, lateral wavelength, local normal velocity, and the projected area of the evolving phase as functions of time. The relevant algorithms have been implemented in Mathematica and are available online.