Specific features of observing magnetization inhomogeneities on the surface of permalloy thin films by means of highly sensitive magnetic-force-microscopy probes

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• 作者：N. A. Djuzhev ; A. M. Kozmin…
• 关键词：magnetic ; force microscopy ; permalloy thin films ; domain walls
• 刊名：Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
• 出版年：2016
• 出版时间：January 2016
• 年：2016
• 卷：10
• 期：1
• 页码：39-42
• 全文大小：2,944 KB
• 参考文献：1.Y.-S. Shin, H.-J. Lee, J. Kim, J. Park, and K. Char, J. Korean Phys. Soc. 44, 904 (2004).
  2.K. Sato, T. Yamamoto, T. Tezuka, T. Ishibashi, Y. Morishita, A. Koukitu, K. Machida, and T. Yamaoka, J. Magn. Magn. Mater. 304, 10 (2006).CrossRef
  3.A. G. Temiryazev, S. A. Saunin, V. E. Sizov, et al., Bull. Russ. Acad. Sci.: Phys. 78, 49 (2014).CrossRef
  4.A. P. Boltaev, F. A. Pudonin, and I. A. Sherstnev, Appl. Phys. Lett. 102, 142404 (2013).CrossRef
  
• 作者单位：N. A. Djuzhev (1)
  A. M. Kozmin (1)
  M. Yu. Chinenkov (1) (2)
  
  1. National Research University of Electronic Technology MIET, Moscow, 124498, Russia
  2. OOO “Spintek”, Moscow, 124498, Russia
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Surfaces and Interfaces and Thin Films
  Russian Library of Science
  
• 出版者：MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
• ISSN：1819-7094

文摘

The results of studying regions of inhomogeneous magnetization on the surface of permalloy thin films with the use of fabricated highly sensitive probes of magnetic force microscopy (MFM) are presented. The technological features of manufacturing MFM probes with a high sensitivity to magnetic-field gradient are analyzed. Regions of ordering of the vertical component of the magnetic field are revealed, and domain walls are visualized in the thin films under study. Nanoscale measurements of the domain-wall thicknesses are performed.