Reliability of repairable reserved systems with failure aftereffect

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• 作者：S. V. Gurov ; L. V. Utkin
• 关键词：Key wordsreliability ; aftereffect ; repairable system ; integral equations ; failure ; load ; time to failure ; Weibull distribution
• 刊名：Automation and Remote Control
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：78
• 期：1
• 页码：113-124
• 全文大小：
• 刊物类别：Mathematics and Statistics
• 刊物主题：Calculus of Variations and Optimal Control; Optimization; Systems Theory, Control; Control, Robotics, Mechatronics; Mechanical Engineering; Computer-Aided Engineering (CAD, CAE) and Design;
• 出版者：Pleiades Publishing
• ISSN：1608-3032
• 卷排序：78

文摘

We propose new models for analyzing the reliability of repairable systems with failure aftereffect, when the probability distribution of an element’s time to failure changes only during the time when another element is being repaired. The key idea here is the so-called coupling principle for various probability distributions when the system’s operation conditions or the “residual lifetime preservation condition” change. We show a method for constructing a system of integral equations as a universal tool for modeling the reliability of systems under the assumption that time to failure of each element obeys the Weibull distribution.