System for Simultaneous Harman-Based Measurement of All Thermoelectric Properties, from 240 to 720?K, by Use of a Novel Calibration Procedure

详细信息    查看全文

• 作者：D. Vasilevskiy ; J.-M. Simard ; R. A. Masut ; S. Turenne
• 关键词：Figure of merit ; thermoelectric measurements ; ZT ; Scanner ; Harman method
• 刊名：Journal of Electronic Materials
• 出版年：2015
• 出版时间：June 2015
• 年：2015
• 卷：44
• 期：6
• 页码：1733-1742
• 全文大小：2,830 KB
• 参考文献：1.H. Wang, W.D. Porter, H. Botner, J. Konig, et al., J. Electr. Mater. 42, 654 (2013).View Article
  2.G.S. Nolas, J. Sharp, and H.J. Goldsmid, Thermoelectrics; Basic Principles and New Materials Developments (Berlin: Springer, 2001), p. 95.
  3.H. Wang, W.D. Porter, H. Botner, J. Konig, et al., J. Electr. Mater. 42, 1073 (2013).View Article
  4.G.J. Snyder and E.S. Toberer, Nat. Mater. 7, 105 (2008).View Article
  5.V.K. Zaitsev, M.I. Fedorov, E.A. Gurieva, I.S. Eremin, et al., Phys. Rev. B 74, 045207 (2006).View Article
  6.Fraunhofer Institute For Measurements Web Site: http://?www.?ipm.?fraunhofer.?de/?content/?dam/?ipm/?en/?PDFs/?Product%20?sheet/?ES/?ZT-Meter870K_?web.?pdf , Accessed June 07, 2014.
  7.T.C. Harman, J. Appl. Phys. 29, 1373 (1958).View Article
  8.T.C. Harman, J.H. Cahn, and M.J. Logan, J. Appl. Phys. 29, 1351 (1959).View Article
  9.R.J. Buist, CRC Handbook of Thermoelectrics (Boca Raton, FL: CRC Press, 1995).
  10.A. Jacquot, M. Jagl, J. Konig, D.G. Ebling, and H. Bottner, 5th European conference on Thermoelectrics, (Odessa, Ukraine, 2007), pp. 90-3.
  11.B. Kwon, S.-H. Baek, S.K. Kim, and J.-S. Kim, Rev. Sci. Instum. 85, 045108 (2014).View Article
  12.H. Iwasaki, T. Yamamoto, H. Kim, and G. Nakamoto, J. Electr. Mater. 42, 1840 (2013).View Article
  13.R.P. Gupta, R. McCarty, and J. Sharp, J. Electr. Mater. 43, 1608 (2014).View Article
  14.J.-M. Simard, D. Vasilevskiy, F. Bélanger, J. L’Ecuyer, and S. Turenne, Proceedings 20th International Conference on Thermoelectrics, (Beijing, China, June 2001), pp. 132-35.
  15.D. Vasilevskiy, J.-M. Simard, F. Bélanger, F. Bernier, S. Turenne, and J. L’Ecuyer, Proceedings 21st International Conference on Thermoelectrics, (Long Beach, California, August 2002), pp. 24-7.
  16.D. Vasilevskiy, R.A. Masut, and S. Turenne, J. Electr. Mater. 41, 1057 (2012).View Article
  
• 作者单位：D. Vasilevskiy (1) (2)
  J.-M. Simard (3)
  R. A. Masut (1)
  S. Turenne (1)
  
  1. Département de Génie Mécanique et Département de Génie Physique, Polytechnique Montréal, C.P. 6079, Succ. Centre-Ville, Montreal, QC, H3C 3A7, Canada
  2. TEMTE Inc, 4665 West Broadway, Montreal, QC, H4B 2A7, Canada
  3. EXAPROM Inc, 40 Saint-Ange, Blainville, QC, J7B 1X1, Canada
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Optical and Electronic Materials
  Characterization and Evaluation Materials
  Electronics, Microelectronics and Instrumentation
  Solid State Physics and Spectroscopy
  
• 出版者：Springer Boston
• ISSN：1543-186X

文摘

The most reliable evaluation of the thermoelectric (TE) figure of merit (ZT) is based on the Harman method, because the physical properties are measured on the same specimen and in the same direction. However, practical realization of this procedure at elevated temperatures is challenging, because of unavoidable heat exchange between the sample and its environment. We report the first successful implementation of this method for simultaneous measurement of the figure of merit, the Seebeck coefficient, and electrical and thermal conductivity on the same specimen in the temperature range 240-20?K, a range which covers most practical TE applications ranging from cooling to energy harvesting at both low and intermediate temperatures. The system we have developed (ZT-Scanner) automatically measures, under vacuum conditions, the properties of specimens from 1 to 6?mm long with cylindrical or rectangular (?5?mm2) cross sections. The reproducibility of consecutive measurements was found to be 1-% of the absolute values of the four properties, in any arbitrary temperature range. The novel two-sample system calibration (2SSC) developed resolves, irrespective of specimen size, geometry, and thermal conductivity, the unavoidable heat exchange between the specimen and the environment, assisting these measurements. We report detailed results from successful implementation of 2SSC for TE characterization of bismuth telluride-based materials from 240 to 450?K and of a large group of other materials including lead telluride, skutterudites, Mg, Si, Sn, and SiGe from 300 to 720?K. The developed ZT-Scanner in combination with the novel 2SSC procedure solve the persistent problem of accurate determination of ZT and its components and can serve as an important instrument for precise evaluation of well-established and new TE materials.