Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si80Ge20 Polycrystalline Alloys

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• 作者：D. Vasilevskiy ; J.-M. Simard ; T. Caillat ; R. A. Masut…
• 关键词：Figure of merit ; thermoelectric measurements ; ZT ; Scanner ; Harman method
• 刊名：Journal of Electronic Materials
• 出版年：2016
• 出版时间：March 2016
• 年：2016
• 卷：45
• 期：3
• 页码：1540-1547
• 全文大小：2,194 KB
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• 作者单位：D. Vasilevskiy (1) (2)
  J.-M. Simard (3)
  T. Caillat (4)
  R. A. Masut (1)
  S. Turenne (1)
  
  1. Polytechnique Montréal, Montreal, QC, H3C 3A7, Canada
  2. TEMTE Inc., Montreal, QC, H4B 2A7, Canada
  3. EXAPROM Inc., Blainville, QC J7B 1X1, Canada
  4. Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, 91109, USA
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Optical and Electronic Materials
  Characterization and Evaluation Materials
  Electronics, Microelectronics and Instrumentation
  Solid State Physics and Spectroscopy
  
• 出版者：Springer Boston
• ISSN：1543-186X

文摘

A Harman-based instrument for the characterization of thermoelectric (TE) materials in a wide temperature range (the ZT-Scanner) was introduced in an earlier publication, with a focus on a two-sample system calibration (2SSC) procedure used for the precise evaluation of thermal losses during the measurements. This technique offers an option to accurately measure the main TE parameters from 300 K to 700 K. We now report the results of ZT-Scanner measurements of p-type Si₈₀Ge₂₀ polycrystalline samples, including the TE figure of merit ZT, Seebeck coefficient, and thermal and electrical conductivities. These samples proved to be extremely stable up to the maximum temperature of measurement, and could eventually serve as a standard for thermoelectric characterization. The measurements were performed using both PbSn solder and conductive silver paste contacts. In all cases, Ni plating was used as a protective barrier between the TE alloys and the contact material. The experimental data has been compared to the typical data measured by the Jet Propulsion Laboratory on similar samples, providing a quantitative estimation of the accuracy of the measurement system, which has been found to be better than 0.015, or 5%, up to 700 K for ZT. The consistency of the TE measurements is evaluated by means of a statistical analysis of repetitive tests on the same and on different samples of identical nature. We also analyze the influence of thermal and electrical contact resistance on the measured properties.