Robust reduction of graphene fluoride using an electrostatically biased scanning probe
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文摘
We report a novel and easily accessible method to chemically reduce graphene fluoride (GF) sheets with nanoscopic precision using high electrostatic fields generated between an atomic force microscope (AFM) tip and the GF substrate. Reduction of fluorine by the electric field produces graphene nanoribbons (GNR) with a width of 105-1,800 nm with sheet resistivity drastically decreased from >1 T.1 (GF) down to 46 k.1 (GNR). Fluorine reduction also changes the topography, friction, and work function of the GF. Kelvin probe force microscopy measurements indicate that the work function of GF is 18080 meV greater than that of graphene. The reduction process was optimized by varying the AFM probe velocity between 1.2 1 and 12 1 and the bias voltage applied to the sample between 8 and 12 V. The electrostatic field required to remove fluorine from carbon is .6 Vm1. Reduction of the fluorine may be due to the softening of the C-F bond in this intense field or to the accumulation and hydrolysis of adventitious water into a meniscus.

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