Prospects for atomic resolution in-line holography for a 3D determination of atomic structures from single projections

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• 作者：F. -R. Chen ; C. Kisielowski ; D. Van Dyck
• 关键词：In ; line holography ; Exit wave function ; Atomic resolution tomography ; 3D molecular imaging
• 刊名：Advanced Structural and Chemical Imaging
• 出版年：2017
• 出版时间：December 2017
• 年：2017
• 卷：3
• 期：1
• 全文大小：3865KB
• 刊物类别：Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Biological Microscopy;
• 刊物主题：Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Biological Microscopy;
• 出版者：Springer International Publishing
• ISSN：2198-0926
• 卷排序：3

文摘

It is now established that the 3D structure of homogeneous nanocrystals can be recovered from in-line hologram of single projections. The method builds on a quantitative contrast interpretation of electron exit wave functions. Since simulated exit wave functions of single and bilayers of graphene reveal the atomic structure of carbon-based materials with sufficient resolution, we explore theoretically how the approach can be expanded beyond periodic carbon-based materials to include non-periodic molecular structures. We show here theoretically that the 3D atomic structure of randomly oriented oleic acid molecules can be recovered from a single projection.