10-Bit single-slope ADC with error calibration for TDI CMOS image sensor

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• 作者：Cen Gao (1)
  Suying Yao (1)
  Zhixun Yang (1)
  Jing Gao (1)
  Jiangtao Xu (1)
  
• 关键词：single ; slope ADC ; error calibration ; CMOS image sensor
• 刊名：Transactions of Tianjin University
• 出版年：2013
• 出版时间：August 2013
• 年：2013
• 卷：19
• 期：4
• 页码：300-306
• 全文大小：810KB
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• 作者单位：Cen Gao (1)
  Suying Yao (1)
  Zhixun Yang (1)
  Jing Gao (1)
  Jiangtao Xu (1)
  
  1. School of Electronic Information Engineering, Tianjin University, Tianjin, 300072, China
  

文摘

A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/.53 LSB and 0.63/.71 LSB, respectively. The sampling rate of the ADC was 32 kHz.