Analysis of scattering properties of nonaxiosymmetric substrate defects by the discrete-source method

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• 作者：N. V. Grishina (1)
  Yu. A. Eremin (1)
  A. G. Sveshnikov (1)
  
• 刊名：Optics and Spectroscopy
• 出版年：2014
• 出版时间：December 2014
• 年：2014
• 卷：117
• 期：6
• 页码：964-970
• 全文大小：475 KB
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  4. N. V. Grishina, Yu. A. Eremin, and A. G. Sveshnikov, Moscow Univ. Phys. Bull. g class="a-plus-plus">67g>, 37 (2007). <a class="external" href="http://dx.doi.org/10.3103/S0027134907010109" target="_blank" title="It opens in new window">CrossRefa>
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  8. Yu. A. Eremin and V. I. Ivakhnenko, Differ. Equations g class="a-plus-plus">37g>, 1459 (2001). <a class="external" href="http://dx.doi.org/10.1023/A:1013328517326" target="_blank" title="It opens in new window">CrossRefa>
  
• 作者单位：N. V. Grishina (1)
  Yu. A. Eremin (1)
  A. G. Sveshnikov (1)
  
  1. Moscow State University, Moscow, 119991, Russia
  
• ISSN：1562-6911

文摘

The discrete-source method is generalized to the case of studying the scattering of polarized light radiation by nonaxisymmetric nanosize substrate defects. Scattering properties of line pits and bumps are analyzed within the framework of a common mathematical model using a “fictitious-particle. Results of the numerical experiment are presented.