Contribution of spontaneous polarization and its fluctuations to refraction of light in ferroelectrics
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  • 作者:P. A. Markovin ; V. A. Trepakov ; A. K. Tagantsev ; A. Deineka…
  • 刊名:Physics of the Solid State
  • 出版年:2016
  • 出版时间:January 2016
  • 年:2016
  • 卷:58
  • 期:1
  • 页码:134-139
  • 全文大小:222 KB
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  • 作者单位:P. A. Markovin (1)
    V. A. Trepakov (1) (2)
    A. K. Tagantsev (1) (3)
    A. Deineka (2)
    D. A. Andreev (4)

    1. Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021, Russia
    2. Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, Prague 8, 182 21, Czech Republic
    3. École polytechnique fédérale de Lausanne (EPFL), Route Cantonale, Lausanne, CH-1015, Switzerland
    4. Peter the Great St. Petersburg Polytechnic University, Politekhnicheskaya ul. 29, Moscow, 195251, Russia
  • 刊物类别:Physics and Astronomy
  • 刊物主题:Physics
    Solid State Physics and Spectroscopy
    Russian Library of Science
  • 出版者:MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
  • ISSN:1090-6460
文摘
The expressions for the spontaneous polar contribution δn i s to the principal values of the refractive index due to the quadratic electro-optic effect in ferroelectrics have been considered within the phenomenological approach taking into account the polarization fluctuations. A method has been proposed for calculating the magnitude and temperature dependence of the root-mean-square fluctuations of the polarization (short-range local polar order) P sh = 〈P fl 2 〉1/2 below the ferroelectric transition temperature T c from temperature changes in the spontaneous polar contribution δn i s (T) if the average spontaneous polarization P s = 〈P〉 characterizing the long-range order is determined from independent measurements (for example, from dielectric hysteresis loops). For the case of isotropic fluctuations, the proposed method has made it possible to calculate P sh and P s only from refractometric measurements. It has been shown that, upon interferometric measurements, the method developed in this work allows calculating P sh and P s directly from the measured temperature and electric-field changes in the relative optical path (the specific optical retardation) of the light. Original Russian Text © P.A. Markovin, V.A. Trepakov, A.K. Tagantsev, A. Deineka, D.A. Andreev, 2016, published in Fizika Tverdogo Tela, 2016, Vol. 58, No. 1, pp. 131–135.

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