(Cd,Mn)Te Crystal Plates for Radiation Detectors: Electrical Contacts and Surface Passivation

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• 作者：M. Witkowska-Baran ; D. Kochanowska ; A. Mycielski…
• 关键词：Electrical contacts ; ohmic contacts ; semiconductor thin films ; MBE technique ; II–VI compounds ; electrical measurements ; passivation
• 刊名：Journal of Electronic Materials
• 出版年：2015
• 出版时间：September 2015
• 年：2015
• 卷：44
• 期：9
• 页码：3174-3179
• 全文大小：1,905 KB
• 参考文献：1.A. Mycielski, A. Burger, M. Sowinska, M. Groza, A. Szadkowski, P. Wojnar, B. Witkowska , W. Kaliszek, and P. Siffert, Phys. Stat. Sol. C 2, 1578 (2005)
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• 作者单位：M. Witkowska-Baran (1)
  D. Kochanowska (1)
  A. Mycielski (1)
  A. J. Szadkowski (1)
  M. Juchniewicz (2)
  E. Kamińska (2)
  
  1. Institute of Physics Polish Academy of Sciences, Al. Lotników 32/46, 02-668, Warsaw, Poland
  2. Institute of Electron Technology, Al. Lotników 32/46, 02-668, Warsaw, Poland
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Optical and Electronic Materials
  Characterization and Evaluation Materials
  Electronics, Microelectronics and Instrumentation
  Solid State Physics and Spectroscopy
  
• 出版者：Springer Boston
• ISSN：1543-186X

文摘

The development of a reliable technique for making good electrical contacts to semi-insulating (Cd,Mn)Te monocrystalline plates meant for x- and gamma radiation detectors, a technique of crystal surface preparation and a technique of passivation of the surfaces between electrodes were the main objectives of the studies. The investigations of the electrical contacts were focused on the amorphous/nanocrystalline contact layers. The effects of passivation of the inter-electrode surfaces on the magnitude of the surface leakage currents were studied. Keywords Electrical contacts ohmic contacts semiconductor thin films MBE technique II–VI compounds electrical measurements passivation