Structures of regenerated cellulose films revealed by grazing incidence small-angle x-ray scattering
详细信息    查看全文
  • 作者:Fernanda F. Rossetti (1)
    Panteleimon Panagiotou (3)
    Florian Rehfeldt (1)
    Emanuel Schneck (1) (2)
    Martin Dommach (5)
    Sergio S. Funari (5)
    Andreas Timmann (5)
    Peter Müller-Buschbaum (3)
    Motomu Tanaka (1) (2)
  • 刊名:Biointerphases
  • 出版年:2008
  • 出版时间:December 2008
  • 年:2008
  • 卷:3
  • 期:4
  • 页码:117-127
  • 全文大小:825KB
  • 参考文献:1. H. J. Gabius and S. Gabius, / Glycoscience (Chapmann and Hall, Weinheim, 1997).
    2. W. D. Comper, / Extracellular Matrix (Harwood, Academic, Amsterdam, 1996).
    3. S. L?fas and B. Johnson, J. Chem. Soc., Chem. Commun. 21, 1526 (1990). CrossRef
    4. J. M. Harris, / Poly (Ethyleneglycol) Chemistry (Plenum, New York, 1992).
    5. J. F. Kennedy, G. O. Phillips, P. A. Williams, and L. Piculell, / Cellulose and Cellulose Derivatives: Physico-Chemical Aspects and Industrial Applications (Woodhead, Cambridge, 1995).
    6. D. Klemm, T. Heinze, B. Philipp, and W. Wagenknecht, Acta Polym. 48, 277 (1997). CrossRef
    7. J. F. Klebe and H. L. Finkbeiner, J. Polym. Sci. (A1) 7, 1947 (1969).
    8. D. Klemm and A. Stein, J. Macromol. Sci., Pure Appl. Chem. A32, 899 (1995).
    9. M. Schaub, G. Wenz, G. Wegner, A. Stein, and D. Klemm, Adv. Mater. 5, 919 (1993). CrossRef
    10. V. Buchholz, P. Adler, M. Backer, W. Holle, A. Simon, and G. Wegner, Langmuir 13, 3206 (1997). CrossRef
    11. H. Hillebrandt, G. Wiegand, M. Tanaka, and E. Sackmann, Langmuir 15, 8451 (1999). CrossRef
    12. M. Tanaka, S. Kaufmann, J. Nissen, and M. Hochrein, Phys. Chem. Chem. Phys. 3, 4091 (2001). CrossRef
    13. M. Tanaka, A. P. Wong, F. Rehfeldt, M. Tutus, and S. Kaufmann, J. Am. Chem. Soc. 126, 3257 (2004). CrossRef
    14. M. Tanaka and E. Sackmann, Nature (London) 437, 656 (2005). CrossRef
    15. S. Gritsch, P. Nollert, F. J?hnig, and E. Sackmann, Langmuir 14, 3118 (1998). CrossRef
    16. E. Poptoshev and P. M. Claesson, Langmuir 18, 1184 (2002). CrossRef
    17. O. J. Rojas, M. Ernstsson, R. D. Neumann, and P. M. Claesson, J. Phys. Chem. B 104, 10032 (2000). CrossRef
    18. F. Rehfeldt and M. Tanaka, Langmuir 19, 1467 (2003). CrossRef
    19. S. Morita, R. Wiesendanger, and E. Meyer, in / Nancoscience and Technology, edited by P. Avouris, K. v. Klizing, H. Sakaki, and R. Wiesendanger (Springer-Verlag, Berlin, 2002).
    20. E. Meyer, H. J. Hug, and R. Bennewitz, / Scanning Probe Microscopy (Springer, Berlin, 2004).
    21. T. Salditt, T. H. Metzger, J. Peisl, and G. Goerigk, J. Phys. D: Appl. Phys. 28, A236 (1995). CrossRef
    22. J. R. Levine, J. B. Cohen, Y. W. Chung, and P. Georgopoulos, J. Appl. Crystallogr. 22, 528 (1989). CrossRef
    23. J. Daillant and M. Alba, Rep. Prog. Phys. 63, 1725 (2000). CrossRef
    24. P. Müller-Buschbaum, Anal. Bioanal. Chem. 376, 3 (2003).
    25. P. Panagiotou, E. Bauer, S. Loi, T. Titz, E. Maurer, and P. Müller-Buschbaum, Z. Kristallogr. 219, 210 (2004). CrossRef
    26. M. Rauscher, T. Salditt, and H. Spohn, Phys. Rev. B 52, 16855 (1995). CrossRef
    27. V. W. Stone, A. M. Jonas, B. Nysten, and R. Legras, Phys. Rev. B 60, 5883 (1999). CrossRef
    28. R. García and R. Peréz, Surf. Sci. Rep. 47, 197 (2002). CrossRef
    29. H. Hillebrandt and M. Tanaka, J. Phys. Chem. B 105, 4270 (2001). CrossRef
    30. D. Bonnel, (Wiley-VCH, Weinheim, 2000).
    31. L. G. Parratt, Phys. Rev. 95, 359 (1954). CrossRef
    32. B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables 54, 181 (1993). CrossRef
    33. S. V. Roth, G. R. J. Artus, M. Rankl, S. Seeger, M. Burghammer, C. Riekel, and P. Muller-Buschbaum, Physica B 357, 190 (2005). CrossRef
  • 作者单位:Fernanda F. Rossetti (1)
    Panteleimon Panagiotou (3)
    Florian Rehfeldt (1)
    Emanuel Schneck (1) (2)
    Martin Dommach (5)
    Sergio S. Funari (5)
    Andreas Timmann (5)
    Peter Müller-Buschbaum (3)
    Motomu Tanaka (1) (2)

    1. Biophysical Chemistry II, Institute of Physical Chemistry and BIOQUANT, University of Heidelberg, INF 253, D-69120, Heidelberg, Germany
    3. Physik-Department, Technische Universit?t München, LS E13, James-Franck-Str.1, D-85747, Garching, Germany
    2. Physik-Department, Technische Universit?t München, LS E22, James-Franck-Str.1, D-85747, Garching, Germany
    5. HASYLAB at DESY, Notkestrasse 85, D-22603, Hamburg, Germany
  • ISSN:1559-4106
文摘
The characteristic in-plane length scales of ultrathin films of regenerated cellulose are measured using noncontact atomic force microscopy (NC-AFM) and grazing incidence small-angle x-ray scattering (GISAXS) in ambient atmosphere and under various humidity conditions. The aim is to elucidate the structural basis for the excellent compatibility of cellulose supports to planar lipid membranes. Films are deposited on silicon wafers by Langmuir-Blodgett (LB) transfer and spin coating. NC-AFM height profiles and the resulting calculated power spectral density functions indicate that both kinds of cellulose films have almost identical root-mean-square roughness values (0.7-.8 nm) and very similar characteristic length scales (32 nm), respectively. GISAXS measurements, both above and below the critical angle of total external reflection, show that the dominant length scales in the bulk and near the surface of the films are comparable (?0 nm). The origin of these length scales can be attributed to the bundle of rodlike molecules of cellulose that result during the regeneration process (i.e., as a consequence of the cleavage of the silyl side chains of trimethylsilylcellulose). Exposure of the cellulose samples to various humidities shows that above a relative humidity of 97% a significant swelling of the films occurs, which is consistent with our previous findings. The swelling of films with more than 30 LB monolayers of cellulose induces a remarkable out-of-plane rearrangement of the cellulose bundles, due to a reduced influence of the solid substrate compared to thinner films with only eight to ten LB monolayers.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700