An efficient prediction framework for multi-parametric yield analysis under parameter variations

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• 作者：Xin Li ; Jin Sun ; Fu Xiao
• 关键词：Key wordsYield prediction ; Parameter variations ; Multi ; parametric yield ; Performance modeling ; Sparse representation
• 刊名：Frontiers of Information Technology & Electronic Engineering
• 出版年：2016
• 出版时间：December 2016
• 年：2016
• 卷：17
• 期：12
• 页码：1344-1359
• 全文大小：
• 刊物类别：Computer Science, general; Electrical Engineering; Computer Hardware; Computer Systems Organization
• 刊物主题：Computer Science, general; Electrical Engineering; Computer Hardware; Computer Systems Organization and Communication Networks; Electronics and Microelectronics, Instrumentation; Communications Engine
• 出版者：Zhejiang University Press
• ISSN：2095-9230
• 卷排序：17

文摘

Due to continuous process scaling, process, voltage, and temperature (PVT) parameter variations have become one of the most problematic issues in circuit design. The resulting correlations among performance metrics lead to a significant parametric yield loss. Previous algorithms on parametric yield prediction are limited to predicting a single-parametric yield or performing balanced optimization for several single-parametric yields. Consequently, these methods fail to predict the multi-parametric yield that optimizes multiple performance metrics simultaneously, which may result in significant accuracy loss. In this paper we suggest an efficient multi-parametric yield prediction framework, in which multiple performance metrics are considered as simultaneous constraint conditions for parametric yield prediction, to maintain the correlations among metrics. First, the framework models the performance metrics in terms of PVT parameter variations by using the adaptive elastic net (AEN) method. Then the parametric yield for a single performance metric can be predicted through the computation of the cumulative distribution function (CDF) based on the multiplication theorem and the Markov chain Monte Carlo (MCMC) method. Finally, a copula-based parametric yield prediction procedure has been developed to solve the multi-parametric yield prediction problem, and to generate an accurate yield estimate. Experimental results demonstrate that the proposed multi-parametric yield prediction framework is able to provide the designer with either an accurate value for parametric yield under specific performance limits, or a multi-parametric yield surface under all ranges of performance limits.