Structure and Optical Properties of Epitaxial Indium Oxide Films Deposited on Y-Stabilized ZrO2 (111) by MOCVD
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  • 作者:Cansong Zhao ; Zhao Li ; Wei Mi ; Caina Luan ; Xianjin Feng
  • 关键词:YSZ (111) substrate ; crystal structure ; metal–organic chemical vapor deposition ; oxides
  • 刊名:Journal of Electronic Materials
  • 出版年:2015
  • 出版时间:August 2015
  • 年:2015
  • 卷:44
  • 期:8
  • 页码:2719-2724
  • 全文大小:2,227 KB
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  • 作者单位:Cansong Zhao (1)
    Zhao Li (1)
    Wei Mi (1)
    Caina Luan (1)
    Xianjin Feng (1)
    Jin Ma (1)

    1. School of Physics, Shandong University, Jinan, 250100, Shandong, China
  • 刊物类别:Chemistry and Materials Science
  • 刊物主题:Chemistry
    Optical and Electronic Materials
    Characterization and Evaluation Materials
    Electronics, Microelectronics and Instrumentation
    Solid State Physics and Spectroscopy
  • 出版者:Springer Boston
  • ISSN:1543-186X
文摘
Indium oxide (In2O3) films have been deposited on Y-stabilized ZrO2 (YSZ) (111) substrates, at temperatures from 500°C to 700°C, by metal–organic chemical vapor deposition. Structural analysis indicated that all the films were cubic bixbyite In2O3 with an out-of-plane relationship of In2O3 (222)||YSZ (111). Crystal quality was best for the film prepared at 600°C. The microstructure of this film was investigated by high-resolution transmission electron microscopy. A theoretical model is proposed for the mechanism of growth, and the in-plane epitaxial relationship of the single crystalline In2O3 film on the YSZ (111) substrate was shown to be In2O3 \( [01\overline{1} ] \)||YSZ \( [01\overline{1} ] \). Average transmittance of the samples in the visible region was >78%.

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