A micro-scale strain rosette for residual stress measurement by SEM Moiré method

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• 作者：RongHua Zhu (1)
  HuiMin Xie (1)
  JianGuo Zhu (1)
  YanJie Li (1) (2)
  ZhiGang Che (3)
  ShiKun Zou (3)
  
• 关键词：residual stress ; focused ion beam ; SEM Moiré method ; ring ; core method ; random phase ; shifting
• 刊名：SCIENCE CHINA Physics, Mechanics & Astronomy
• 出版年：2014
• 出版时间：April 2014
• 年：2014
• 卷：57
• 期：4
• 页码：716-722
• 全文大小：787 KB
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• 作者单位：RongHua Zhu (1)
  HuiMin Xie (1)
  JianGuo Zhu (1)
  YanJie Li (1) (2)
  ZhiGang Che (3)
  ShiKun Zou (3)
  
  1. Key Laboratory of Applied Mechanics (AML), Department of Engineering Mechanics, Tsinghua University, Beijing, 100084, China
  2. School of Civil Engineering and Architecture, University of Jinan, Jinan, 250022, China
  3. Beijing Aeronautical Manufacturing Technology Research Institute, Beijing, 100024, China
  
• ISSN：1869-1927

文摘

In this paper, a new method combining focused ion beam (FIB) and scanning electron microscope (SEM) Moiré technique for the measurement of residual stress at micro scale is proposed. The FIB is employed to introduce stress relief like the macro ring-core method and fabricate gratings with a frequency of 5000 lines/mm on the measured area of the sample surface. Three groups of gratings in different radial directions are manufactured in order to form a micro-scale strain rosette. After milling ring-core by FIB, the deformation incurred by relief of the stress will be recorded with the strain rosette. The displacement/strain field can be measured using SEM scanning Moiré with random phase-shifting algorithm. In this study, the Nickel alloy GH4169 sample (which was processed by laser shock peening) is selected as a study object to determine its residual stress. The results showed that the components of the in-plane principal stresses were ?59 MPa and ?07 MPa, respectively, which show good agreement with the results obtained from the available literature.