详细信息    查看全文

• 作者：Sung-Yun Lee ; Hui Eun Kim ; William Jo ; Young-Hwan Kim…
• 关键词：CaCu3Ti4O12 films ; pulsed laser deposition ; dielectric property ; Poole ; Frenkel conduction model ; leakage current
• 刊名：Electronic Materials Letters
• 出版年：2015
• 出版时间：November 2015
• 年：2015
• 卷：11
• 期：6
• 页码：1003-1011
• 全文大小：2,401 KB
• 参考文献：1.H. Gong, X. Wang, Z. Tian, H. Whang, and L. Li, Electron. Mater. Lett. 10, 417 (2014).CrossRef
  2.K. Shubham and P. Chakrabarti, Electron. Mater. Lett. 10, 579 (2014).CrossRef
  3.M. A. Subramanian, D. Li, N. Duan, B. A. Reisner, and A. W. Sleight, J. Solid State Chem. 151, 323 (2000).CrossRef
  4.C. C. Homes, T. Vogt, S. M. Shapiro, S. Wakimoto, and A. P. Ramirez, Science 293, 673 (2001).CrossRef
  5.D. C. Sinclair, T. B. Adams, F. D. Morrison, and A. R. West, Appl. Phys. Lett. 80, 2153 (2002).CrossRef
  6.T. B. Adam, D. C. Sinclair, and A. R. West, Adv. Mater. 14, 1321 (2002).CrossRef
  7.F. Amaral, L. C. Costa, and M. A. Valente, J. Non-Cryst Solids 357, 775 (2011).CrossRef
  8.M. Li, G. Cai, D. F. Zhang, W. Y. Wang, W. J. Wang, and X. L. Chen, J. Appl. Phys. 104, 074107 (2008).CrossRef
  9.L. Feng, X. Tang, Y. Yan, X. Chen, Z. Jiao, and G. Cao, Phys. Stat. Sol. (a), 203, R22 (2006).CrossRef
  10.E. A. Patterson, S. Kwon, C. C. Huang, and D. P. Cann, Appl. Phys. Lett. 87, 182911 (2005).CrossRef
  11.M. Li, G. Cai, D. F. Zhang, W. Y. Wang, W. J. Wang, and X. L. Chen, J. Appl. Phys. 104, 074107 (2008).CrossRef
  12.C. H. Mu, P. Liu, Y. He, J. P. Zhou, and H. W. Zhang, J. Alloy. Compd. 471, 137 (2009).CrossRef
  13.H. E. Kim, S. M. Choi, S. Y. Lee, Y. W. Hong, and S. I. Yoo, Electron. Mater. Lett. 9, 325 (2013).CrossRef
  14.H. E. Kim, S. M. Choi, Y. W. Hong, and S. I. Yoo, J. Alloy Compd. 610, 594 (2014).CrossRef
  15.L. Fang, M. Shen, and Z. Li, J. Appl. Phys. 100, 104101 (2006).CrossRef
  16.L. Fang, M. Shen, J. Yang, and Z. Li, Solid. State. Commun. 137, 381 (2006).CrossRef
  17.S. Y. Lee, D. K. Yoo, and S. I. Yoo, Electron. Mater. Lett. 3, 23 (2007).
  18.S. Y. Lee, Y. W. Hong, and S. I. Yoo, Electron. Mater. Lett. 7, 287 (2011).CrossRef
  19.S. Y. Lee, Y. H. Kim, K. J. Choi, S. M. Jung, and S. I. Yoo, Thin Solid Films, 518, 5711 (2010).CrossRef
  20.S. Y. Lee, S. M. Choi, M. Y. Kim, S. I. Yoo, J. H. Lee, W. Jo, Y. H. Kim, and K. J. Choi, J. Mater. Res. 26, 2543 (2011).CrossRef
  21.W. Zhu, J. Cheng, S. Yu, J. Gong, and Z. Meng, Appl. Phys. Lett. 90, 032907 (2007).CrossRef
  22.L. Z. Cao, B. L. Cheng, S. Y. Wang, Y. L. Zhou, and K. J. Jin, J. Appl. Phys. 98, 034106 (2005).CrossRef
  23.V. Reymond, D. Michau, S. Payan, and M. Maglione, J. Phys.:Condens. Matter. 16, 9155 (2004).
  24.A. Vorobiev, P. Rundqvist, and K. Khamchane, J. Appl. Phys. 96, 4642 (2004).CrossRef
  25.R. L. Nigro, G. Malandrino, R. G. Toro, M. Losurdo, G. Bruno, and I. L. Fragala, J. Am. Chem. Soc. 127, 13772 (2005).CrossRef
  
• 作者单位：Sung-Yun Lee (1)
  Hui Eun Kim (1)
  William Jo (2)
  Young-Hwan Kim (3)
  Sang-Im Yoo (1)
  
  1. Department of Materials Science and Engineering, Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul, 151-744, Korea
  2. Department of Physics, Ewha Womans University, Seoul, 120-750, Korea
  3. Nano-Materials Center, Korea Institute of Science and Technology, Seoul, 136-791, Korea
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Condensed Matter Physics
  Electronics, Microelectronics and Instrumentation
  Optical and Electronic Materials
  Thermodynamics
  Characterization and Evaluation of Materials
  
• 出版者：The Korean Institute of Metals and Materials, co-published with Springer Netherlands
• ISSN：2093-6788

文摘

We report the greatly improved dielectric properties of CaCu₃Ti₄O₁₂ (CCTO) films with a 60 nm-thick CaTiO₃ (CTO) interlayer on Pt/TiO₂/SiO₂/Si substrates. Both CCTO films and CTO interlayers were prepared by pulsed laser deposition (PLD). With increasing the thickness of CCTO from 200 nm to 1.3 μm, the dielectric constants (ε _r ) at 10 kHz in both CCTO single-layered and CCTO/CTO double-layered films increased from ?60 to ?000 and from ?30 to ?700, respectively. Compared with CCTO single-layered films, CCTO/CTO double-layered films irrespective of CCTO film thickness exhibited a remarkable decrease in their dielectric losses (tanδ) (<0.1 at the frequency region of 1 - 100 kHz) and highly reduced leakage current density at room temperature. The reduced leakage currents in CCTO/CTO double-layered films are attributable to relatively higher trap ionization energies in the Poole-Frenkel conduction model.