Characterization of microwave dielectric materials NiZrNb₂O₈ based on the chemical bond theory

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• 作者：X. S. Jiang ; H. L. Pan ; Z. B. Feng ; H. T. Wu
• 刊名：Journal of Materials Science: Materials in Electronics
• 出版年：2016
• 出版时间：October 2016
• 年：2016
• 卷：27
• 期：10
• 页码：10963-10969
• 全文大小：1,005 KB
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Optical and Electronic Materials
  Characterization and Evaluation Materials
  
• 出版者：Springer New York
• ISSN：1573-482X
• 卷排序：27

文摘

Wolframite structure NiZrNb₂O₈ ceramics were prepared by the solid state reaction method. Sintering characteristics and microwave dielectric properties were investigated under various sintering temperatures ranging from 1100 to 1300 °C. The micro-structure, crystal structure and phase composition were studied by the scanning electron microscopy techniques, X-ray diffraction and energy disperse spectroscopy, respectively. Refinement was used to analyze the crystal structure. Based on the cell parameters, the chemical bond theory was used to calculate the lattice energy, bond ionicity and the coefficient of thermal expansion for the characterization of correlations between properties and structures of NiZrNb₂O₈ ceramics. The microwave dielectric properties of NiZrNb₂O₈ were strongly dependent on the chemical bond ionicity, lattice energy and coefficient of thermal expansion. The ε_r values could be strongly dependent on the bond ionicity of the Nb–O bonds. The Q·f values were affected by the lattice energy of Nb–O bonds. As for the τ_f values, it could be mainly affected by the coefficient of thermal expansion of Ni–O bonds. At the sintering temperature of 1250 °C, NiZrNb₂O₈ ceramics exhibited the excellent microwave properties of ε_r = 18.84, Q·f = 18, 142 GHz and τ_f = −35.43 ppm/°C.