Crystal structure and magnetic properties of Fe_xPd_1−x thin films annealed at 550 °C

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• 作者：T. Liu ; L. Ma ; S. Q. Zhao ; D. D. Ma ; L. Li…
• 刊名：Journal of Materials Science: Materials in Electronics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：28
• 期：4
• 页码：3616-3620
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Optical and Electronic Materials; Characterization and Evaluation of Materials;
• 出版者：Springer US
• ISSN：1573-482X
• 卷排序：28

文摘

Polycrystalline Fe_xPd_1−x (x = 37–64 at.%) films with thicknesses of 47 ± 2 nm were prepared by dc magnetron sputtering on quartz glass substrates and subsequent annealing at 550 °C for 3 h. The evolution of crystal structure and magnetic properties with different Fe concentrations were investigated. For the Pd-rich FePd films, the A1 disordered phase and soft magnetic properties were found. The Fe-rich FePd films are more favorable to the formation of an ordered L1₀ phase. For Fe concentration of 51 at.%, the sample exhibits the highest coercivity, magnetic energy product and remanence ratio at room temperature, corresponding to 3.5 kOe, 17.6 MGOe and 0.94, respectively, and the coercivity increases to ~4.3 kOe at 120 K. The disorder-order transition temperature is evidently reduced to 550 °C and magnetic properties are improved in this work. These FePd films have shown promise for application as high-density magnetic recording medium.