Quasiparticle Transport in Thick Aluminum Films Coupled to Tungsten Transition Edge Sensors

详细信息    查看全文

• 作者：J. J. Yen ; J. M. Kreikebaum ; B. A. Young ; B. Cabrera…
• 刊名：Journal of Low Temperature Physics
• 出版年：2016
• 出版时间：July 2016
• 年：2016
• 卷：184
• 期：1-2
• 页码：30-37
• 全文大小：1,349 KB
• 刊物类别：Physics and Astronomy
• 刊物主题：Physics
  Condensed Matter
  Characterization and Evaluation Materials
  Magnetism and Magnetic Materials
  
• 出版者：Springer Netherlands
• ISSN：1573-7357
• 卷排序：184

文摘

We have fabricated and characterized test devices of a new geometry for cryogenic dark matter search superconducting sensors. The modified design uses the same photolithography masks used to fabricate earlier-generation devices, but with the Al and W films deposited in reverse order. This inverted film geometry (Al over W instead of our conventional W over Al) offers a simplified and robust way to dramatically increase the thickness of Al energy-collecting fins coupled to thin W-TESs—tungsten-transition edge sensors. Data are presented from experiments with inverted geometry test devices exposed to X-rays from a NaCl fluorescence source. The results are compared to data obtained with similar devices fabricated in the standard, non-inverted geometry.KeywordsTungstenAluminumTransition edge sensor (TES)Quasiparticle trappingQuasiparticle diffusionX-ray fluorescenceSuperconducting film