Determination of the thickness of an electrodeposited thorium film with SiC alpha detectors

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• 作者：Josh Jarrell ; Milan Stika ; Max Chaiken…
• 关键词：Alpha spectrometry ; SiC ; Electrodeposition ; Thin film ; Molten salt
• 刊名：Journal of Radioanalytical and Nuclear Chemistry
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：311
• 期：2
• 页码：1127-1133
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Nuclear Chemistry; Physical Chemistry; Nuclear Physics, Heavy Ions, Hadrons; Diagnostic Radiology; Inorganic Chemistry;
• 出版者：Springer Netherlands
• ISSN：1588-2780
• 卷排序：311

文摘

Alpha spectroscopy can be used to quantify actinide (e.g., U, Pu) concentration in a molten salt electrorefining environment. One could electroplate actinide samples directly onto a semiconductor alpha particle detector to obtain representative isotopic concentrations from a measured alpha particle energy spectrum. In this work, we fabricated a SiC Schottky device that can be partially biased to a depletion depth of 8.8 µm that is able to measure the energy spectrum of 4.012 MeV alpha particles emitted from a thorium film with a thickness. We also present a method in calculating the thickness of a medium thick alpha source with a dE/dx detector.