Surface instability of an imperfectly bonded thin elastic film under surface van der Waals forces

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• 作者：Xu Wang ; Rong Jing
• 关键词：Thin film ; Surface instability ; van der Waals force ; Surface energy ; Imperfect interface ; Bifurcation analysis
• 刊名：Zeitschrift für angewandte Mathematik und Physik
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：68
• 期：1
• 全文大小：
• 刊物主题：Theoretical and Applied Mechanics; Mathematical Methods in Physics;
• 出版者：Springer International Publishing
• ISSN：1420-9039
• 卷排序：68

文摘

This paper studies surface instability of a thin elastic film imperfectly bonded to a rigid substrate interacting with a rigid contactor through van der Waals forces under plane strain conditions. The film–substrate interface is modeled as a linear spring with vanishing thickness described in terms of the normal and tangential interface parameters. Depending on the ratio of the two imperfect interface parameters, the critical value of the Poisson’s ratio for the occurrence of surface wrinkling in the absence of surface energy can be greater than, equal to, or smaller than 0.25, which is the critical Poisson’s ratio for a perfect film–substrate interface. The critical surface energy for the inhibition of the surface wrinkling is also obtained. Finally, we propose a very simple and effective method to study the surface instability of a multilayered elastic film with imperfect interfaces interacting with a rigid contactor or with another multilayered elastic film (or a multilayered simply supported plate) with imperfect interfaces.