Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip

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• 作者：Yongda Yan (8) (9)
  Yang Sun (10) (8) (9)
  Jiran Li (9)
  Zhenjiang Hu (8) (9)
  Xuesen Zhao (9)
  
  8. The State Key Laboratory of Robotics and Systems ; Robotics Institute ; Harbin Institute of Technology ; Harbin ; Heilongjiang ; 150008 ; P.R. China
  9. Center for Precision Engineering ; Harbin Institute of Technology ; Harbin ; Heilongjiang ; 150001 ; People鈥檚 Republic of China
  10. Harbin Institute of Technology ; P.O. Box 413 ; Harbin ; Heilongjiang ; 150001 ; China
  
• 关键词：Atomic force microscope (AFM) ; Polycarbonate (PC) ; Scratching ; Ripples
• 刊名：Nanoscale Research Letters
• 出版年：2014
• 出版时间：December 2014
• 年：2014
• 卷：9
• 期：1
• 全文大小：1,230 KB
• 参考文献：1. Mccrum, NG, Buckley, CP, Bucknall, CB (1997) Principles of Polymer Engineering. Oxford University Press, New York
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• 刊物主题：Nanotechnology; Nanotechnology and Microengineering; Nanoscale Science and Technology; Nanochemistry; Molecular Medicine;
• 出版者：Springer US
• ISSN：1556-276X

文摘

The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process.