Multi-instrument characterization of five nanodiamond samples: a thorough example of nanomaterial characterization

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• 作者：Bhupinder Singh ; Stacey J. Smith ; David S. Jensen…
• 关键词：Nanodiamond ; XPS ; ToF ; SIMS ; XRD ; TEM ; DRIFT
• 刊名：Analytical and Bioanalytical Chemistry
• 出版年：2016
• 出版时间：February 2016
• 年：2016
• 卷：408
• 期：4
• 页码：1107-1124
• 全文大小：3,014 KB
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• 作者单位：Bhupinder Singh (1)
  Stacey J. Smith (1)
  David S. Jensen (2)
  Hodge F. Jones (3)
  Andrew E. Dadson (2)
  Paul B. Farnsworth (1)
  Richard Vanfleet (4)
  Jeffrey K. Farrer (4)
  Matthew R. Linford (1)
  
  1. Department of Chemistry and Biochemistry, C100 Benson Science Building, Brigham Young University, Provo, UT, 84602, USA
  2. Diamond Analytics, 1260 South 1600 West, Orem, UT, 84058, USA
  3. Advanced Abrasives Corporation, 7980 National Hwy, Pennsauken, NJ, 08110, USA
  4. Department of Physics and Astronomy, Brigham Young University, N283 ESC, Provo, UT, 84602, USA
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Analytical Chemistry
  Food Science
  Inorganic Chemistry
  Physical Chemistry
  Monitoring, Environmental Analysis and Environmental Ecotoxicology
  
• 出版者：Springer Berlin / Heidelberg
• ISSN：1618-2650

文摘

Here, we report the most comprehensive characterization of nanodiamonds (NDs) yet undertaken. Five different samples from three different vendors were analyzed by a suite of analytical techniques, including X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), inductively coupled plasma mass spectrometry (ICP-MS), diffuse reflectance infrared Fourier transform (DRIFT) spectroscopy, X-ray diffraction (XRD), transmission electron microscopy (TEM), electron energy loss spectroscopy (EELS), Brunauer-Emmett-Teller (BET) surface area measurements, and particle size distribution (PSD) measurements. XPS revealed the elemental compositions of the ND surfaces (83–87 at.% carbon and 12–14 at.% oxygen) with varying amounts of nitrogen (0.4–1.8 at.%), silicon (0.1–0.7 at.%), and tungsten (0.3 at.% only in samples from one vendor). ToF-SIMS and ICP showed metal impurities (Al, Fe, Ni, Cr, etc. with unexpectedly high amounts of W in one vendor’s samples: ca. 900 ppm). Principal component analyses were performed on the ToF-SIMS and ICP data. DRIFT showed key functional groups (–OH, C=O, C–O, and C=C). BET showed surface areas of 50–214 m2/g. XRD and TEM revealed PSD (bimodal distribution and a wide PSD, 5–100 nm, for one vendor’s samples). XRD also provided particle sizes (2.7–27 nm) and showed the presence of graphite. EELS gave the sp2/sp3 contents of the materials (37–88 % sp3). PSD measurements were performed via differential sedimentation of the particles (mean particle size ca. 17–50 nm). This comprehensive understanding should allow for improved construction of nanodiamond-based materials.