Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra
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- 作者：V. P. Afanas’ev ; A. S. Gryazev…
- 关键词：cross section for inelastic energy losses ; plasma oscillations ; ionization ; multiple scattering ; Electron Energy Loss Spectroscopy ; X ; ray photoelectron spectroscopy ; method of invariant imbedding ; Backward Differential Formula (BDF) ; XPS ; PES ; EELS
- 刊名：Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
- 出版年：2016
- 出版时间：September 2016
- 年：2016
- 卷：10
- 期：5
- 页码：906-911
- 全文大小：646 KB
- 刊物类别：Chemistry and Materials Science
- 刊物主题：Chemistry
Surfaces and Interfaces and Thin Films
Russian Library of Science - 出版者：MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
- ISSN：1819-7094
- 卷排序：10
文摘
The photoelectron spectroscopy model is based on the solution of the radiative transfer equation with inner sources. The exact numerical solutions using BDF method are presented. PES, XAES and EELS spectra are described as series by the number of inelastic scatterings. Differential inverse inelastic mean free path for Be and W are obtained from the experimental data by the fitting procedure.