XPS depth profiling investigations on La2Zr2O7 layers prepared by chemical solution deposition

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• 作者：Steffen Oswald ; Kerstin Knoth and Bernhard Holzapfel
• 关键词：Key words ; X ; ray photoelectron spectroscopy ; depth profiling ; chemical solution deposition ; LZO ; buffer layer ; YBCO coated conductors.
• 刊名：Microchimica Acta
• 出版年：2006
• 出版时间：November, 2006
• 年：2006
• 卷：156
• 期：1-2
• 页码：121-124
• 全文大小：288 KB
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Analytical Chemistry
  Inorganic Chemistry
  Physical Chemistry
  Characterization and Evaluation Materials
  Monitoring, Environmental Analysis and Environmental Ecotoxicology
  
• 出版者：Springer Wien
• ISSN：1436-5073

文摘

La₂Zr₂O₇ (LZO) layers have been recently investigated as potential buffer layers for superconducting YBa₂Cu₃O_7–x coated conductors deposited on Ni tapes. Chemical solution deposition was used for LZO layer preparation. X-ray photoelectron spectroscopy (XPS) depth profiling is demonstrated to be an important method for layer characterization in addition to X-ray diffraction techniques. XPS measurements revealed layers that are homogeneous in depth, very smooth, and have no significant impurities. A slight difference to the nominal La:Zr stoichimetry is discussed in combination with structural defects that are suspected from spectral changes during ion sputtering.