Statistical Capacitance Modeling and Extraction
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- ContentType：Book Chapter
- DOI：10.1007/978-1-4614-0788-1_11
- Publisher：Springer US
- Author ：Ruijing Shen ; Sheldon X.-D. Tan ; Hao Yu
- PrintIssn_Isbn：978-1-4614-0787-4
- OnlineIssn_Isbn：978-1-4614-0788-1
- SubjectCategory：Engineering
- Copyright：2012
- SeriesParentPublication：Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
- Pages：=163-182